Autori: Young Chadwin D
| Naslov | Experimental Evaluation of Circuit-Based Modeling of the NBTI Effects in Double-Gate FinFETs (Article) |
| Autori | Jankovic Nebojsa D Young Chadwin D |
| Info | MICROELECTRONICS RELIABILITY, (2016), vol. 59 br. , str. 26-29 |
| Projekat | Ministry of Education and Science Republic of Serbia [OI171026] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
