Autori: Vracar Ljubomir M
| Naslov | Constant voltage stress induced current in Ta2O5 stacks and its dependence on a gate electrode (Article) |
| Autori | Atanassova E Stojadinovic Ninoslav D Paskaleva A Spassov D Vracar Ljubomir M Georgieva M |
| Info | SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (2008), vol. 23 br. 7, str. - |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Stress-induced leakage currents in thin silicon dioxide films (Article) |
| Autori | Pesic Biljana Vracar Ljubomir M Stojadinovic Ninoslav D Pecovska-Djordjevic M Novkovski N |
| Info | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, (2003), vol. 14 br. 10-12, str. 805-807 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science |
