Autori: Stanimirovic Ivanka P
| Naslov | Packaging and Reliability Issues in Microelectromechanical Systems (Proceedings Paper) |
| Autori | Stanimirovic Ivanka P Stanimirovic Zdravko I |
| Info | 2014 29TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS PROCEEDINGS - MIEL 2014, (2014), vol. br. , str. 333-336 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
| Naslov | Mechanical Characterization of MEMS Materials (Proceedings Paper) |
| Autori | Stanimirovic Zdravko I Stanimirovic Ivanka P |
| Info | 2012 28TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL), (2012), vol. br. , str. 177-179 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
| Naslov | MEMS Reliability (Proceedings Paper) |
| Autori | Stanimirovic Ivanka P Stanimirovic Zdravko I |
| Info | 2012 28TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL), (2012), vol. br. , str. 173-175 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
| Naslov | Analysis of mechanical and electrical straining effects on TFRs - Statistical bimodal conductance approach (Proceedings Paper) |
| Autori | Stanimirovic Zdravko I Jevtic Milan M Stanimirovic Ivanka P |
| Info | 2008 26TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS, (2008), vol. br. , str. 575-577 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
| Naslov | Noise and resistance as indicators of HVP stressing impact on performances of conventional TFRs (Proceedings Paper) |
| Autori | Stanimirovic Ivanka P Jevtic Milan M Stanimirovic Zdravko I |
| Info | 2008 26TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS, (2008), vol. br. , str. 571-574 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
| Naslov | Simultaneous mechanical and electrical straining of conventional thick-film resistors (Article) |
| Autori | Stanimirovic Zdravko I Jevtic Milan M Stanimirovic Ivanka P |
| Info | MICROELECTRONICS RELIABILITY, (2008), vol. 48 br. 1, str. 59-67 |
| Ispravka | ISI/Web of Science Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Multiple high-voltage pulse stressing of conventional thick-film resistors (Article) |
| Autori | Stanimirovic Ivanka P Jevtic Milan M Stanimirovic Zdravko I |
| Info | MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 12 , Suppl. , str. 2242 -2248 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Influence of simultaneous mechanical and electrical straining on conventional thick-film resistors (Proceedings Paper) |
| Autori | Stanimirovic Zdravko I Jevtic Milan M Stanimirovic Ivanka P |
| Info | 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 627-630 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
| Naslov | Performances of conventional thick-film resistors after multiple high-voltage pulse (Proceedings Paper) |
| Autori | Stanimirovic Ivanka P Jevtic Milan M Stanimirovic Zdravko I |
| Info | 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 623-625 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
| Naslov | Computer simulation of thick-film resistors based on 3D planar RRN model (Proceedings Paper) |
| Autori | Stanimirovic Zdravko I Jevtic Milan M Stanimirovic Ivanka P |
| Info | Eurocon 2005: The International Conference on Computer as a Tool, Vol 1 and 2 , Proceedings, (2005), vol. br. , str. 1687-1690 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
