Autori: Ristic Goran S
| Naslov | Modelling of time delay of electrical breakdown for nitrogen-filled tubes at pressures of 6.6 and 13.3 mbar in the increase region of the memory curve (Article) |
| Autori | Nesic Nikola T Ristic Goran S Karamarkovic Jugoslav P Pejovic Momcilo M |
| Info | JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2008), vol. 41 br. 22, str. - |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Influence of ionizing radiation and hot carrier injection on metal-oxide-semiconductor transistors (Review) |
| Autori | Ristic Goran S |
| Info | JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2008), vol. 41 br. 2, str. - |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Analysis of neutral active particle loss in afterglow in krypton at 2.6 mbar pressure (Article) |
| Autori | Pejovic Momcilo M Karamarkovic Jugoslav P Ristic Goran S Pejovic Milic M |
| Info | PHYSICS OF PLASMAS, (2008), vol. 15 br. 1 , Suppl. , str. - |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Physico-chemical processes in metal-oxide-semiconductor transistors with thick gate oxide during high electric field stress (Article) |
| Autori | Ristic Goran S Pejovic Momcilo M Jaksic Aleksandar B |
| Info | JOURNAL OF NON-CRYSTALLINE SOLIDS, (2007), vol. 353 br. 2, str. 170-179 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing (Article) |
| Autori | Ristic Goran S Pejovic Momcilo M Jaksic Aleksandar B |
| Info | APPLIED SURFACE SCIENCE, (2006), vol. 252 br. 8, str. 3023-3032 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Fowler-Nordheim high electric field stress of power VDMOSFETs (Article) |
| Autori | Ristic Goran S Pejovic Momcilo M Jaksic Aleksandar B |
| Info | SOLID-STATE ELECTRONICS, (2005), vol. 49 br. 7, str. 1140-1152 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Gamma and UV radiation effects on breakdown voltage of neon-filled tube (Article) |
| Autori | Pejovic Milic M Pejovic Momcilo M Ristic Goran S |
| Info | IEEE TRANSACTIONS ON PLASMA SCIENCE, (2005), vol. 33 br. 3, str. 1047-1052 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Comparison between post-irradiation annealing and post-high electric field stress annealing of n-channel power VDMOSFETs (Article) |
| Autori | Ristic Goran S Pejovic Momcilo M Jaksic Aleksandar B |
| Info | APPLIED SURFACE SCIENCE, (2003), vol. 220 br. 1-4, str. 181-185 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Memory effects in argon, nitrogen, and hydrogen (Article) |
| Autori | Pejovic Momcilo M Ristic Goran S |
| Info | IEEE TRANSACTIONS ON PLASMA SCIENCE, (2002), vol. 30 br. 3, str. 1315-1319 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Influence of tube wall material type and tube temperature on the recombination processes of nitrogen ions and atoms in afterglow (Article) |
| Autori | Pejovic Momcilo M Ristic Goran S Milosavljevic Cedomir S Pejovic Milic M |
| Info | JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2002), vol. 35 br. 20, str. 2536-2542 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
