Autori: Radovic Ivan S
Naslov | Analysis of SiO2 thin film deposited by reactive sputtering (Article) |
Autori | Radovic Ivan S Serruys Yves Limoge Yves Jaoul O Romcevic Nebojsa Z Poissonnet S Bibic Natasa M |
Info | RECENT DEVELOPMENTS IN ADVANCED MATERIALS AND PROCESSES, (2006), vol. 518 br. , str. 149-154 |
Ispravka | ISI/Web of Science Elečas Rang časopisa Citati: ISI/Web of Science |