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Naslov An Electromechanical Approach to a Printed Circuit Board Design Course (Article)
Autori Dankovic Danijel M  Vracar Ljubomir M  Prijic Aneta P  Prijic Zoran D 
Info IEEE TRANSACTIONS ON EDUCATION, (2013), vol. 56 br. 4, str. 470-477
Projekat Serbian Ministry of Education and Science [TR32026]; Ei PCB Factory, Nis, Serbia
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs (Article)
Autori Dankovic Danijel M  Manic Ivica Dj  Prijic Aneta P  Davidovic Vojkan S  Djoric-Veljkovic Snezana M  Golubovic Snezana M  Prijic Zoran D  Stojadinovic Ninoslav D 
Info INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, (2013), vol. 43 br. 1, str. 58-66
Projekat Ministry of Education and Science of the Republic of Serbia [OI171026, TR32026]; Ei PCB Factory, Nis, Serbia
Ispravka ISI/Web of Science   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors (Article)
Autori Prijic Aneta P  Dankovic Danijel M  Vracar Ljubomir M  Manic Ivica Dj  Prijic Zoran D  Stojadinovic Ninoslav D 
Info MEASUREMENT SCIENCE & TECHNOLOGY, (2012), vol. 23 br. 8, str. -
Projekat Serbian Ministry of Education and Science[OI171026, TR32026]; Ei PCB Factory, Nis
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Capacitive Pressure Sensing Based Key in PCB Technology for Industrial Applications (Article)
Autori Vracar Ljubomir M  Prijic Aneta P  Vuckovic Dusan  Prijic Zoran D 
Info IEEE SENSORS JOURNAL, (2012), vol. 12 br. 5, str. 1496-1503
Projekat Serbian Ministry of Education and Science[TR32026]; Ei PCB Factory, Nis
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions (Article)
Autori Manic Ivica Dj  Dankovic Danijel M  Prijic Aneta P  Davidovic Vojkan S  Djoric-Veljkovic Snezana M  Golubovic Snezana M  Prijic Zoran D  Stojadinovic Ninoslav D 
Info MICROELECTRONICS RELIABILITY, (2011), vol. 51 br. 9-11, str. 1540-1543
Projekat Ministry of Science of the Republic of Serbia[0171026, TR32026]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress (Proceedings Paper)
Autori Stojadinovic Ninoslav D  Dankovic Danijel M  Manic Ivica Dj  Prijic Aneta P  Davidovic Vojkan S  Djoric-Veljkovic Snezana M  Golubovic Snezana M  Prijic Zoran D 
Info MICROELECTRONICS RELIABILITY, (2010), vol. 50 br. 9-11, str. 1278-1282
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Design and Optimization of S-Type Thermal Cutoffs (Article)
Autori Prijic Aneta P  Prijic Zoran D  Pesic Biljana  Pantic Dragan S  Ristic Stojan  Mancic Dragan D  Petrusic Zoran M 
Info IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, (2008), vol. 31 br. 4, str. 904-912
Projekat Serbian Ministry of Science and Technology
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov A new method of evaluation of liquidus temperatures of ternary alloys (Proceedings Paper)
Autori Prijic Aneta P  Prijic Zoran D  Pesic Biljana 
Info 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 395-398
Ispravka ISI/Web of Science   Citati: ISI/Web of Science  
Naslov Analytical modelling of electrical characteristics in gamma-irradiated power VDMOS transistors (Article)
Autori Manic Ivica Dj  Pavlovic Zoran  Prijic Zoran D  Davidovic Vojkan S  Stojadinovic Ninoslav D 
Info MICROELECTRONICS JOURNAL, (2001), vol. 32 br. 5-6, str. 485-490
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
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