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Autori: Pesic Biljana

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Naslov Simulation of semiconductor bulk trap influence on the electrical characteristics of the n-channel power VDMOS transistor (Article)
Autori Aleksic Sanja M  Pesic Biljana  Pantic Dragan S 
Info INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, (2013), vol. 43 br. 2, str. 124-130
Projekat Ministry of Education and Science of the Republic of Serbia [TR 33035]
Ispravka ISI/Web of Science   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Design and Optimization of S-Type Thermal Cutoffs (Article)
Autori Prijic Aneta P  Prijic Zoran D  Pesic Biljana  Pantic Dragan S  Ristic Stojan  Mancic Dragan D  Petrusic Zoran M 
Info IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, (2008), vol. 31 br. 4, str. 904-912
Projekat Serbian Ministry of Science and Technology
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov A new method of evaluation of liquidus temperatures of ternary alloys (Proceedings Paper)
Autori Prijic Aneta P  Prijic Zoran D  Pesic Biljana 
Info 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 395-398
Ispravka ISI/Web of Science   Citati: ISI/Web of Science  
Naslov Computer as powerful tool in reliability testing of thin gate dielectrics in MOS devices (Proceedings Paper)
Autori Vracar Ljubomir M  Pesic Biljana  Stojadinovic Ninoslav D 
Info Eurocon 2005: The International Conference on Computer as a Tool, Vol 1 and 2 , Proceedings, (2005), vol. br. , str. 1159-1162
Ispravka ISI/Web of Science   Citati: ISI/Web of Science  
Naslov Stress-induced leakage currents in thin silicon dioxide films (Article)
Autori Pesic Biljana  Vracar Ljubomir M  Stojadinovic Ninoslav D  Pecovska-Djordjevic M  Novkovski N 
Info JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, (2003), vol. 14 br. 10-12, str. 805-807
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science  
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