Autori: Pejovic Momcilo M
| Naslov | Gamma-ray irradiation and post-irradiation responses of high dose range RADFETs (Article) |
| Autori | Jaksic Aleksandar B Ristic Goran S Pejovic Momcilo M Mohammadzadeh A Sudre C Lane W |
| Info | IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (2002), vol. 49 br. 3, str. 1356-1363 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Electrical breakdown in low pressure gases (Review) |
| Autori | Pejovic Momcilo M Ristic Goran S Karamarkovic Jugoslav P |
| Info | JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2002), vol. 35 br. 10, str. R91-R103 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Analysis of mechanisms which lead to electrical breakdown in argon using the time delay method (Article) |
| Autori | Pejovic Momcilo M Ristic Goran S |
| Info | PHYSICS OF PLASMAS, (2002), vol. 9 br. 1, str. 364-370 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Memory effects in the afterglow: open questions on long-lived species and the role of surface processes (Article) |
| Autori | Petrovic Zoran Lj Markovic Vidosav Lj Pejovic Momcilo M Gocic Sasa R |
| Info | JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2001), vol. 34 br. 12, str. 1756-1768 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Properties of latent interface-trap buildup in irradiated metal-oxide-semiconductor transistors determined by switched bias isothermal annealing experiments (Article) |
| Autori | Jaksic Aleksandar B Pejovic Momcilo M Ristic Goran S |
| Info | APPLIED PHYSICS LETTERS, (2000), vol. 77 br. 25, str. 4220-4222 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Analysis of mechanisms which lead to electrical breakdown in a krypton-filled tube using the time delay method (Article) |
| Autori | Pejovic Momcilo M Ristic Goran S |
| Info | JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2000), vol. 33 br. 21, str. 2786-2790 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Isothermal and isochronal annealing experiments on irradiated commercial power VDMOSFETs (Article) |
| Autori | Jaksic Aleksandar B Pejovic Momcilo M Ristic Goran S |
| Info | IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (2000), vol. 47 br. 3, str. 659-666 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | New experimental evidence of latent interface-trap buildup in power VDMOSFETs (Article) |
| Autori | Jaksic Aleksandar B Ristic Goran S Pejovic Momcilo M |
| Info | IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (2000), vol. 47 br. 3, str. 580-586 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Nitrogen-filled tube as a sensor of ionizing radiation (Article) |
| Autori | Pejovic Momcilo M Ristic Goran S |
| Info | REVIEW OF SCIENTIFIC INSTRUMENTS, (2000), vol. 71 br. 6, str. 2377-2379 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Analysis of postirradiation annealing of n-channel power vertical double-diffused metal-oxide-semiconductor transistors (Article) |
| Autori | Ristic Goran S Pejovic Momcilo M Jaksic Aleksandar B |
| Info | JOURNAL OF APPLIED PHYSICS, (2000), vol. 87 br. 7, str. 3468-3477 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
