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Autori: Paskaleva Albena

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Naslov Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors (Article)
Autori Djoric-Veljkovic Snezana M  Zivanovic Emilija N  Davidovic Vojkan S  Veljkovic Sandra  Mitrovic Nikola I  Ristic Goran S  Paskaleva Albena  Spassov Dencho  Dankovic Danijel M 
Info MICROMACHINES, (2025), vol. 16 br. 1, str. -
Projekat European Union's Horizon 2024 research and innovation program [SPS G5974-"High-k Dielectric RADFET]; European Union's Horizon 2024 research and innovation program through the AIDA4Edge Twinning project [101160293]; Ministry of Science, Technological Development and Innovation of the Republic of Serbia [451-03-65/2024-03/200102, 451-03-65/2024-03/200095]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa  
Naslov A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress (Article)
Autori Zivanovic Emilija N  Veljkovic Sandra  Mitrovic Nikola I  Jovanovic Igor D  Djoric-Veljkovic Snezana M  Paskaleva Albena  Spassov Dencho  Dankovic Danijel M 
Info MICROMACHINES, (2024), vol. 15 br. 4, str. -
Projekat Serbian Ministry of Science, Technological Development and Innovation
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa  
Naslov Self-heating of stressed VDMOS devices under specific operating conditions (Article)
Autori Veljkovic Sandra  Mitrovic Nikola I  Jovanovic Igor D  Zivanovic Emilija N  Paskaleva Albena  Spassov Dencho  Mancic Dragan D  Dankovic Danijel M 
Info MICROELECTRONICS RELIABILITY, (2023), vol. 150 br. , str. -
Projekat Ministry of Education, Science, Technological Development and Innovation of the Republic of Serbia [451-03-9/2021-14/200102]; Bulgarian National Scientific Fund [KP-06-H37/32]; [SPS G5974]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa  
Naslov Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress (Article)
Autori Veljkovic Sandra  Mitrovic Nikola I  Davidovic Vojkan S  Golubovic Snezana M  Djoric-Veljkovic Snezana M  Paskaleva Albena  Spassov Dencho  Stankovic Srboljub J  Andjelkovic Marko Lj  Prijic Zoran D  Manic Ivica Dj  Prijic Aneta P  Ristic Goran S  Dankovic Danijel M 
Info JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, (2022), vol. 31 br. 18, str. -
Projekat European Union's Horizon 2020 research and innovation program [857558-ELICSIR]; Ministry of Education, Science and Technology Development of the Republic of Serbia [451-03-9/2021-14/200102]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Radiation Tolerance and Charge Trapping Enhancement of ALD HfO2/Al2O3 Nanolaminated Dielectrics (Article)
Autori Spassov Dencho  Paskaleva Albena  Guziewicz Elzbieta  Davidovic Vojkan S  Stankovic Srboljub J  Djoric-Veljkovic Snezana M  Ivanov Tzvetan  Stanchev Todor  Stojadinovic Ninoslav D 
Info MATERIALS, (2021), vol. 14 br. 4, str. -
Projekat Bulgarian National Scientific Fund [KP-06-H37/32]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Impact of gamma Radiation on Charge Trapping Properties of Nanolaminated HfO2/Al2O3 ALD Stacks (Proceedings Paper)
Autori Spassov Dencho  Paskaleva Albena  Davidovic Vojkan S  Djoric-Veljkovic Snezana M  Stankovic Srboljub J  Stojadinovic Ninoslav D  Ivanov Tzvetan  Stanchev Todor 
Info 2019 IEEE 31ST INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL 2019), (2019), vol. br. , str. 59-62
Ispravka ISI/Web of Science   Citati: ISI/Web of Science   Scopus  
Naslov A review of pulsed NBTI in P-channel power VDMOSFETs (Review)
Autori Dankovic Danijel M  Manic Ivica Dj  Prijic Aneta P  Davidovic Vojkan S  Prijic Zoran D  Golubovic Snezana M  Djoric-Veljkovic Snezana M  Paskaleva Albena  Spassov Dencho  Stojadinovic Ninoslav D 
Info MICROELECTRONICS RELIABILITY, (2018), vol. 82 br. , str. 28-36
Projekat Ministry of Science of the Republic of Serbia [OI-171026, TR-32026]; SASA [F-148]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Modelling of Threshold Voltage Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs (Proceedings Paper)
Autori Dankovic Danijel M  Manic Ivica Dj  Stojadinovic Ninoslav D  Prijic Zoran D  Djoric-Veljkovic Snezana M  Davidovic Vojkan S  Prijic Aneta P  Paskaleva Albena  Spassov Dencho  Golubovic Snezana M 
Info 2017 IEEE 30TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL), (2017), vol. br. , str. 147-151
Projekat Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026]; Serbian Academy of Sciences and Arts (SASA) [F-148]
Ispravka ISI/Web of Science   Citati: ISI/Web of Science   Scopus  
Naslov Electrical and Charge Trapping Properties of HfO2/Al2O3 Multilayer Dielectric Stacks (Proceedings Paper)
Autori Davidovic Vojkan S  Paskaleva Albena  Spassov Dencho  Guziewicz Elzbieta  Krajewski T  Golubovic Snezana M  Djoric-Veljkovic Snezana M  Manic Ivica Dj  Dankovic Danijel M  Stojadinovic Ninoslav D 
Info 2017 IEEE 30TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL), (2017), vol. br. , str. 143-146
Projekat SASA [F-148]
Ispravka ISI/Web of Science   Citati: ISI/Web of Science   Scopus  
Naslov Hf-doped Ta2O5 stacks under constant voltage stress (Article)
Autori Manic Ivica Dj  Atanassova E  Stojadinovic Ninoslav D  Spassov Dencho  Paskaleva Albena 
Info MICROELECTRONIC ENGINEERING, (2011), vol. 88 br. 3, str. 305-313
Projekat Bulgarian National Science Foundation [DTK 02/50]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
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