Autori: Paskaleva A
| Naslov | Time-dependent dielectric breakdown in pure and lightly Al-doped Ta2O5 stacks (Article) |
| Autori | Atanassova E Stojadinovic Ninoslav D Spassov Dencho Manic Ivica Dj Paskaleva A |
| Info | SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (2013), vol. 28 br. 5, str. - |
| Projekat | Bulgarian National Science Foundation [DTK 02/50] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Degradation behavior of Ta2O5 stacks and its dependence on the gate electrode (Proceedings Paper) |
| Autori | Atanassova E Stojadinovic Ninoslav D Paskaleva A |
| Info | MICROELECTRONICS RELIABILITY, (2008), vol. 48 br. 8-9, str. 1193-1197 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Constant voltage stress induced current in Ta2O5 stacks and its dependence on a gate electrode (Article) |
| Autori | Atanassova E Stojadinovic Ninoslav D Paskaleva A Spassov D Vracar Ljubomir M Georgieva M |
| Info | SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (2008), vol. 23 br. 7, str. - |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
