Autori: Ntemou E
| Naslov | Argon ions deeply implanted in silicon studied by Rutherford/Elastic Backscattering and Grazing Incidence X-ray Fluorescence spectroscopy (Article; Proceedings Paper) |
| Autori | Kokkoris M Androulakaki EG Czyzycki M Eric Marko V Karydas AG Leani JJ Mighori A Ntemou E Paneta V Petrovic Snjezana B |
| Info | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, (2019), vol. 450 br. , str. 144-148 |
| Projekat | IAEA CRP-G42005 'Experiments with Synchrotron Radiation for Modern Environmental and Industrial Applications' [18262] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
