Autori: Mitrovic Nikola I
| Naslov | Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs (Article) |
| Autori | Dankovic Danijel M Davidovic Vojkan S Golubovic Snezana M Veljkovic Sandra Mitrovic Nikola I Djoric-Veljkovic Snezana M |
| Info | MICROELECTRONICS RELIABILITY, (2021), vol. 126 br. , str. - |
| Projekat | Ministry of Education, Science and Technological Development, Serbia [OI-171026, TR-32026]; [F-148] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method (Article) |
| Autori | Mitrovic Nikola I Dankovic Danijel M Randjelovic Branislav M Prijic Zoran D Stojadinovic Ninoslav D |
| Info | INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, (2020), vol. 50 br. 3, str. 205-214 |
| Projekat | Ministry of Education, Science and Technological Development of the Republic of Serbia; Serbian Academy of Science and Arts |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Modeling of NBTS Effects in P-Channel Power VDMOSFETs (Article) |
| Autori | Dankovic Danijel M Mitrovic Nikola I Prijic Zoran D Stojadinovic Ninoslav D |
| Info | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, (2020), vol. 20 br. 1, str. 204-213 |
| Projekat | Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026]; Serbian Academy of Sciences and Arts [F-148] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
