Pronađeno: 31-40 / 49 radova

Autori: Manic Ivica Dj

>> Filter: Samo Article i Review

Naslov Electrical stressing effects in commercial power VDMOSFETs (Article)
Autori Stojadinovic Ninoslav D  Manic Ivica Dj  Davidovic Vojkan S  Dankovic Danijel M  Djoric-Veljkovic Snezana M  Golubovic Snezana M  Dimitrijev Sima 
Info IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, (2006), vol. 153 br. 3, str. 281-288
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Lifetime estimation in NBT stressed P-channel power VDMOSFETs (Proceedings Paper)
Autori Dankovic Danijel M  Manic Ivica Dj  Djoric-Veljkovic Snezana M  Davidovic Vojkan S  Golubovic Snezana M  Stojadinovic Ninoslav D 
Info 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 645-648
Ispravka ISI/Web of Science   Citati: ISI/Web of Science  
Naslov Spontaneous recovery in DC gate bias stressed power VDMOSFETs (Proceedings Paper)
Autori Manic Ivica Dj  Djoric-Veljkovic Snezana M  Davidovic Vojkan S  Dankovic Danijel M  Golubovic Snezana M  Stojadinovic Ninoslav D 
Info 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 639-644
Ispravka ISI/Web of Science   Citati: ISI/Web of Science  
Naslov Negative bias temperature instability mechanisms in p-channel power VDMOSFETs (Article)
Autori Stojadinovic Ninoslav D  Dankovic Danijel M  Djoric-Veljkovic Snezana M  Davidovic Vojkan S  Manic Ivica Dj  Golubovic Snezana M 
Info MICROELECTRONICS RELIABILITY, (2005), vol. 45 br. 9-11, str. 1343-1348
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Effects of electrical stressing in power VDMOSFETS (Article)
Autori Stojadinovic Ninoslav D  Manic Ivica Dj  Davidovic Vojkan S  Dankovic Danijel M  Djoric-Veljkovic Snezana M  Golubovic Snezana M  Dimitrijev Sima 
Info MICROELECTRONICS RELIABILITY, (2005), vol. 45 br. 1, str. 115-122
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Burn-in stressing effects on post-irradiation annealing response of power VDMOSFETs (Proceedings Paper)
Autori Djoric-Veljkovic Snezana M  Manic Ivica Dj  Davidovic Vojkan S  Golubovic Snezana M  Stojadinovic Ninoslav D 
Info 2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2, (2004), vol. br. , str. 701-704
Ispravka ISI/Web of Science   Citati: ISI/Web of Science  
Naslov An improved analytical model of IGBT in forward conduction mode (Proceedings Paper)
Autori Pavlovic Zoran  Manic Ivica Dj  Stojadinovic Ninoslav D 
Info 2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2, (2004), vol. br. , str. 163-166
Ispravka ISI/Web of Science   Citati: ISI/Web of Science  
Naslov Effects of electrical stressing in power VDMOSFETs (Proceedings Paper)
Autori Stojadinovic Ninoslav D  Manic Ivica Dj  Davidovic Vojkan S  Dankovic Danijel M  Djoric-Veljkovic Snezana M  Golubovic Snezana M  Dimitrijev Sima 
Info 2003 IEEE CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS, (2003), vol. br. , str. 291-296
Ispravka ISI/Web of Science   Citati: ISI/Web of Science  
Naslov Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs (Article)
Autori Djoric-Veljkovic Snezana M  Manic Ivica Dj  Davidovic Vojkan S  Golubovic Snezana M  Stojadinovic Ninoslav D 
Info MICROELECTRONICS RELIABILITY, (2003), vol. 43 br. 9-11, str. 1455-1460
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Effects of burn-in stressing on radiation response of power VDMOSFETs (Article)
Autori Stojadinovic Ninoslav D  Djoric-Veljkovic Snezana M  Manic Ivica Dj  Davidovic Vojkan S  Golubovic Snezana M 
Info MICROELECTRONICS JOURNAL, (2002), vol. 33 br. 11, str. 899-905
Ispravka ISI/Web of Science   Članak   Citati: ISI/Web of Science   Scopus  
Ispis zapisa u formatu:TXT | BibTeX