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Autori: Jevtic Milan M

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Naslov A novel analytical model of a SiC MOSFET (Proceedings Paper)
Autori Ramovic Rifat M  Jevtic Milan M  Hadzi-Vukovic Jovan M  Randjelovic Danijela V 
Info 2002 23RD INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS, (2002), vol. br. , str. 447-450
Ispravka ISI/Web of Science   Citati: ISI/Web of Science   Scopus  
Naslov Photoluminescence caused by presence of defects and oxides at the surface of Hg1-xCdxTe (Proceedings Paper)
Autori Scepanovic Maja J  Hinic Ivana I  Jevtic Milan M 
Info 2002 23RD INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS, (2002), vol. br. , str. 381-384
Ispravka ISI/Web of Science   Citati: ISI/Web of Science   Scopus  
Naslov Effects of Hg evaporation in numerical simulation of laser induced changes in Hg1-xCdxTe (Article)
Autori Jevtic Milan M  Scepanovic Maja J 
Info PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, (2002), vol. 191 br. 1, str. 77-88
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov A method for VCO phase noise analysis (Proceedings Paper)
Autori Simic D  Hadzi-Vukovic Jovan M  Jevtic Milan M 
Info TELSIKS 2001, VOL 1 & 2, PROCEEDINGS, (2001), vol. br. , str. 309-312
Ispravka ISI/Web of Science   Citati: ISI/Web of Science   Scopus  
Naslov Raman measurements of laser-induced structural and compositional disorder in Hg1-chi Cd chi Te (Article)
Autori Scepanovic Maja J  Jevtic Milan M 
Info JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2001), vol. 34 br. 23, str. 3418-3423
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Evaluation of thick-film resistor structural parameters based on noise index measurements (Article)
Autori Jevtic Milan M  Stanimirovic Zdravko I  Stanimirovic Ivanka P 
Info MICROELECTRONICS RELIABILITY, (2001), vol. 41 br. 1, str. 59-66
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
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