Autori: Jevtic Milan M
| Naslov | Noise and structural properties of reactively sputtered RuO2 thin films (Article) |
| Autori | Jevtic Milan M Jelenkovic Emil V Tong KY Pang GKH |
| Info | THIN SOLID FILMS, (2006), vol. 496 br. 2, str. 214-220 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Low frequency noise as a tool to study optocouplers with phototransistors (Article) |
| Autori | Jevtic Milan M |
| Info | MICROELECTRONICS RELIABILITY, (2004), vol. 44 br. 7, str. 1123-1130 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | High-voltage pulse stressing of thick-film resistors and noise (Article) |
| Autori | Stanimirovic Ivanka P Jevtic Milan M Stanimirovic Zdravko I |
| Info | MICROELECTRONICS RELIABILITY, (2003), vol. 43 br. 6, str. 905-911 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | An alternative method for transistor low frequency noise estimation by measuring phase noise of test oscillator (Article) |
| Autori | Jevtic Milan M Hadzi-Vukovic Jovan M Ramovic Rifat M |
| Info | MICROELECTRONICS JOURNAL, (2002), vol. 33 br. 11, str. 955-960 |
| Ispravka | ISI/Web of Science Članak Citati: ISI/Web of Science Scopus |
| Naslov | Effects of Hg evaporation in numerical simulation of laser induced changes in Hg1-xCdxTe (Article) |
| Autori | Jevtic Milan M Scepanovic Maja J |
| Info | PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, (2002), vol. 191 br. 1, str. 77-88 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Raman measurements of laser-induced structural and compositional disorder in Hg1-chi Cd chi Te (Article) |
| Autori | Scepanovic Maja J Jevtic Milan M |
| Info | JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2001), vol. 34 br. 23, str. 3418-3423 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Evaluation of thick-film resistor structural parameters based on noise index measurements (Article) |
| Autori | Jevtic Milan M Stanimirovic Zdravko I Stanimirovic Ivanka P |
| Info | MICROELECTRONICS RELIABILITY, (2001), vol. 41 br. 1, str. 59-66 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
