Autori: Jevtic Milan M
| Naslov | Effect of fluorination and hydrogenation by ion implantation on reliability of poly-Si TFTs under gamma irradiation (Article) |
| Autori | Jelenkovic Emil V Ristic Goran S Pejovic Milic M Jevtic Milan M Jha Shrawan K Videnovic-Misic Mirjana S Pejovic Momcilo M Tong KY |
| Info | JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2011), vol. 44 br. 1, str. - |
| Projekat | Hong Kong Polytechnic University ; Ministry of Science and Technology Development of Republic of Serbia [141008B] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Low frequency noise as a tool for diagnostic of ESD degraded GaAs mesfets (Article) |
| Autori | Jevtic Milan M Hadzi-Vukovic Jovan M |
| Info | JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, (2009), vol. 11 br. 2, str. 155-163 |
| Projekat | Serbian Ministry of Science and Environmental Protection |
| Ispravka | ISI/Web of Science Elečas Rang časopisa Citati: ISI/Web of Science |
| Naslov | Impact of bias condition on 1/f noise of dual-gate depletion type MOSFET in linear region and consequences for noise diagnostic application and modelling (Article) |
| Autori | Videnovic-Misic Mirjana S Jevtic Milan M |
| Info | MICROELECTRONICS RELIABILITY, (2008), vol. 48 br. 7, str. 1008-1014 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Diagnostic of silicon piezoresistive pressure sensors by low frequency noise measurements (Article) |
| Autori | Jevtic Milan M Smiljanic Miloljub A |
| Info | SENSORS AND ACTUATORS A-PHYSICAL, (2008), vol. 144 br. 2, str. 267-274 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Simultaneous mechanical and electrical straining of conventional thick-film resistors (Article) |
| Autori | Stanimirovic Zdravko I Jevtic Milan M Stanimirovic Ivanka P |
| Info | MICROELECTRONICS RELIABILITY, (2008), vol. 48 br. 1, str. 59-67 |
| Ispravka | ISI/Web of Science Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | On temperature coefficient of resistance of boron-doped SiGe films deposited by sputtering (Article) |
| Autori | Jelenkovic Emil V Jevtic Milan M Tong KY Pang GKH Cheung WY Jha Shrawan K |
| Info | MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, (2007), vol. 10 br. 4-5, str. 143-149 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science |
| Naslov | Multiple high-voltage pulse stressing of conventional thick-film resistors (Article) |
| Autori | Stanimirovic Ivanka P Jevtic Milan M Stanimirovic Zdravko I |
| Info | MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 12 , Suppl. , str. 2242 -2248 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Diagnostics of GaAsHEMT based on noise measurements (Article) |
| Autori | Jevtic Milan M Hadzi-Vukovic Jovan M |
| Info | JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, (2007), vol. 9 br. 11 , Suppl. , str. 3579 -3584 |
| Ispravka | ISI/Web of Science Elečas Rang časopisa Citati: ISI/Web of Science |
| Naslov | Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements (Article) |
| Autori | Jevtic Milan M Hadzi-Vukovic Jovan M |
| Info | MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 1, str. 51-58 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | The voltage pulse degraded Ti/4H-SiC Schottky diodes studied with I-V and low frequency noise measurements (Article) |
| Autori | Hadzi-Vukovic Jovan M Jevtic Milan M |
| Info | DIAMOND AND RELATED MATERIALS, (2007), vol. 16 br. 1, str. 81-89 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
