Autori: Jevtic Milan M
| Naslov | Effect of fluorination and hydrogenation by ion implantation on reliability of poly-Si TFTs under gamma irradiation (Article) |
| Autori | Jelenkovic Emil V Ristic Goran S Pejovic Milic M Jevtic Milan M Jha Shrawan K Videnovic-Misic Mirjana S Pejovic Momcilo M Tong KY |
| Info | JOURNAL OF PHYSICS D-APPLIED PHYSICS, (2011), vol. 44 br. 1, str. - |
| Projekat | Hong Kong Polytechnic University ; Ministry of Science and Technology Development of Republic of Serbia [141008B] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Low frequency noise as a tool for diagnostic of ESD degraded GaAs mesfets (Article) |
| Autori | Jevtic Milan M Hadzi-Vukovic Jovan M |
| Info | JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, (2009), vol. 11 br. 2, str. 155-163 |
| Projekat | Serbian Ministry of Science and Environmental Protection |
| Ispravka | ISI/Web of Science Elečas Rang časopisa Citati: ISI/Web of Science |
| Naslov | The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements (Proceedings Paper) |
| Autori | Hadzi-Vukovic Jovan M Jevtic Milan M Glavanovics M Rothleitner H |
| Info | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, (2008), vol. 205 br. 11, str. 2544-2547 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science |
| Naslov | Impact of bias condition on 1/f noise of dual-gate depletion type MOSFET in linear region and consequences for noise diagnostic application and modelling (Article) |
| Autori | Videnovic-Misic Mirjana S Jevtic Milan M |
| Info | MICROELECTRONICS RELIABILITY, (2008), vol. 48 br. 7, str. 1008-1014 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Analysis of mechanical and electrical straining effects on TFRs - Statistical bimodal conductance approach (Proceedings Paper) |
| Autori | Stanimirovic Zdravko I Jevtic Milan M Stanimirovic Ivanka P |
| Info | 2008 26TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS, (2008), vol. br. , str. 575-577 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
| Naslov | Noise and resistance as indicators of HVP stressing impact on performances of conventional TFRs (Proceedings Paper) |
| Autori | Stanimirovic Ivanka P Jevtic Milan M Stanimirovic Zdravko I |
| Info | 2008 26TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS, (2008), vol. br. , str. 571-574 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
| Naslov | Influence of inner transistors working modes on DGMOSFET 1/f noise (Proceedings Paper) |
| Autori | Videnovic-Misic Mirjana S Jevtic Milan M |
| Info | 2008 26TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS, (2008), vol. br. , str. 557-560 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
| Naslov | Diagnostic of silicon piezoresistive pressure sensors by low frequency noise measurements (Article) |
| Autori | Jevtic Milan M Smiljanic Miloljub A |
| Info | SENSORS AND ACTUATORS A-PHYSICAL, (2008), vol. 144 br. 2, str. 267-274 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Simultaneous mechanical and electrical straining of conventional thick-film resistors (Article) |
| Autori | Stanimirovic Zdravko I Jevtic Milan M Stanimirovic Ivanka P |
| Info | MICROELECTRONICS RELIABILITY, (2008), vol. 48 br. 1, str. 59-67 |
| Ispravka | ISI/Web of Science Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Modelling of dual-gate MOSFET 1/f noise in linear region (Proceedings Paper) |
| Autori | Videnovic-Misic Mirjana S Jevtic Milan M |
| Info | EUROCON 2007: THE INTERNATIONAL CONFERENCE ON COMPUTER AS A TOOL, VOLS 1-6, (2007), vol. br. , str. 459-465 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
