Autori: Hadzi-Vukovic Jovan M
| Naslov | Low frequency noise as a tool for diagnostic of ESD degraded GaAs mesfets (Article) |
| Autori | Jevtic Milan M Hadzi-Vukovic Jovan M |
| Info | JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, (2009), vol. 11 br. 2, str. 155-163 |
| Projekat | Serbian Ministry of Science and Environmental Protection |
| Ispravka | ISI/Web of Science Elečas Rang časopisa Citati: ISI/Web of Science |
| Naslov | Diagnostics of GaAsHEMT based on noise measurements (Article) |
| Autori | Jevtic Milan M Hadzi-Vukovic Jovan M |
| Info | JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, (2007), vol. 9 br. 11 , Suppl. , str. 3579 -3584 |
| Ispravka | ISI/Web of Science Elečas Rang časopisa Citati: ISI/Web of Science |
| Naslov | Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements (Article) |
| Autori | Jevtic Milan M Hadzi-Vukovic Jovan M |
| Info | MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 1, str. 51-58 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | The voltage pulse degraded Ti/4H-SiC Schottky diodes studied with I-V and low frequency noise measurements (Article) |
| Autori | Hadzi-Vukovic Jovan M Jevtic Milan M |
| Info | DIAMOND AND RELATED MATERIALS, (2007), vol. 16 br. 1, str. 81-89 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | An alternative method for transistor low frequency noise estimation by measuring phase noise of test oscillator (Article) |
| Autori | Jevtic Milan M Hadzi-Vukovic Jovan M Ramovic Rifat M |
| Info | MICROELECTRONICS JOURNAL, (2002), vol. 33 br. 11, str. 955-960 |
| Ispravka | ISI/Web of Science Članak Citati: ISI/Web of Science Scopus |
