Autori: Guirado Damian
| Naslov | Thermal Annealing-Induced Recovery of the VT of Irradiated Commercial MOS Transistors (Article; Early Access) |
| Autori | Mitrovic Nikola I Guirado Damian Dankovic Danijel M Palma Alberto J Ristic Goran S Carvajal Miguel A |
| Info | JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, (2024), vol. br. , str. - |
| Projekat | Ministry of Science, Technological Development and Innovations of the Republic of Serbia [451-03-65/2024-03/200102]; European Union's Horizon 2020 research and innovation program [857558 - ELICSIR] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: |
