Autori: Exarchos M
Naslov | Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors (Article) |
Autori | Kouvatsos DN Davidovic Vojkan S Papaioannou GJ Stojadinovic Ninoslav D Michalas L Exarchos M Voutsas AT Goustouridis D |
Info | MICROELECTRONICS RELIABILITY, (2004), vol. 44 br. 9-11, str. 1631-1636 |
Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |