Pronađeno: 1-10 / 52 radova

Autori: Djoric-Veljkovic Snezana M

>> Filter: Samo Article i Review

Naslov Chemical Stabilisation of Clayey Soil-Comparison of a Variety of Additives with Respect to Their Effects on the Soil Compressive Strength and Shear Strength (Article)
Autori Bonic Zoran  Zlatanovic Elefterija M  Marinkovic Nemanja  Romic Nikola Z  Davidovic Nebojsa M  Djoric-Veljkovic Snezana M  Djordjevic Dragan M 
Info BUILDINGS, (2025), vol. 15 br. 4, str. -
Projekat Science Fund of the Republic of Serbia; [7742530]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa  
Naslov Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors (Article)
Autori Djoric-Veljkovic Snezana M  Zivanovic Emilija N  Davidovic Vojkan S  Veljkovic Sandra  Mitrovic Nikola I  Ristic Goran S  Paskaleva Albena  Spassov Dencho  Dankovic Danijel M 
Info MICROMACHINES, (2025), vol. 16 br. 1, str. -
Projekat European Union's Horizon 2024 research and innovation program [SPS G5974-"High-k Dielectric RADFET]; European Union's Horizon 2024 research and innovation program through the AIDA4Edge Twinning project [101160293]; Ministry of Science, Technological Development and Innovation of the Republic of Serbia [451-03-65/2024-03/200102, 451-03-65/2024-03/200095]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa  
Naslov Comparative Study of the Effects of Conventional, Waste, and Alternative Materials on the Geomechanical Properties of Clayey Soil in the Chemical Soil Stabilisation Technique (Article)
Autori Zlatanovic Elefterija M  Marinkovic Nemanja  Bonic Zoran  Romic Nikola Z  Djoric-Veljkovic Snezana M  Cvetkovic Dusan  Djordjevic Dragan 
Info APPLIED SCIENCES-BASEL, (2024), vol. 14 br. 14, str. -
Projekat Science Fund of the Republic of Serbia [7742530]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa  
Naslov A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress (Article)
Autori Zivanovic Emilija N  Veljkovic Sandra  Mitrovic Nikola I  Jovanovic Igor D  Djoric-Veljkovic Snezana M  Paskaleva Albena  Spassov Dencho  Dankovic Danijel M 
Info MICROMACHINES, (2024), vol. 15 br. 4, str. -
Projekat Serbian Ministry of Science, Technological Development and Innovation
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa  
Naslov Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications (Article)
Autori Mitrovic Nikola I  Veljkovic Sandra  Davidovic Vojkan S  Djoric-Veljkovic Snezana M  Golubovic Snezana M  Zivanovic Emilija N  Prijic Zoran D  Dankovic Danijel M 
Info MICROELECTRONICS RELIABILITY, (2022), vol. 138 br. , str. -
Projekat European Union [857558]; Republic of Serbia [451-03-9/2021-14/200102]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science  
Naslov Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress (Article)
Autori Veljkovic Sandra  Mitrovic Nikola I  Davidovic Vojkan S  Golubovic Snezana M  Djoric-Veljkovic Snezana M  Paskaleva Albena  Spassov Dencho  Stankovic Srboljub J  Andjelkovic Marko Lj  Prijic Zoran D  Manic Ivica Dj  Prijic Aneta P  Ristic Goran S  Dankovic Danijel M 
Info JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, (2022), vol. 31 br. 18, str. -
Projekat European Union's Horizon 2020 research and innovation program [857558-ELICSIR]; Ministry of Education, Science and Technology Development of the Republic of Serbia [451-03-9/2021-14/200102]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs (Article)
Autori Dankovic Danijel M  Davidovic Vojkan S  Golubovic Snezana M  Veljkovic Sandra  Mitrovic Nikola I  Djoric-Veljkovic Snezana M 
Info MICROELECTRONICS RELIABILITY, (2021), vol. 126 br. , str. -
Projekat Ministry of Education, Science and Technological Development, Serbia [OI-171026, TR-32026]; [F-148]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Radiation Tolerance and Charge Trapping Enhancement of ALD HfO2/Al2O3 Nanolaminated Dielectrics (Article)
Autori Spassov Dencho  Paskaleva Albena  Guziewicz Elzbieta  Davidovic Vojkan S  Stankovic Srboljub J  Djoric-Veljkovic Snezana M  Ivanov Tzvetan  Stanchev Todor  Stojadinovic Ninoslav D 
Info MATERIALS, (2021), vol. 14 br. 4, str. -
Projekat Bulgarian National Scientific Fund [KP-06-H37/32]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Impact of gamma Radiation on Charge Trapping Properties of Nanolaminated HfO2/Al2O3 ALD Stacks (Proceedings Paper)
Autori Spassov Dencho  Paskaleva Albena  Davidovic Vojkan S  Djoric-Veljkovic Snezana M  Stankovic Srboljub J  Stojadinovic Ninoslav D  Ivanov Tzvetan  Stanchev Todor 
Info 2019 IEEE 31ST INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL 2019), (2019), vol. br. , str. 59-62
Ispravka ISI/Web of Science   Citati: ISI/Web of Science   Scopus  
Naslov NBTI and irradiation related degradation mechanisms in power VDMOS transistors (Article; Proceedings Paper)
Autori Stojadinovic Ninoslav D  Djoric-Veljkovic Snezana M  Davidovic Vojkan S  Golubovic Snezana M  Stankovic Srboljub J  Prijic Aneta P  Prijic Zoran D  Manic Ivica Dj  Dankovic Danijel M 
Info MICROELECTRONICS RELIABILITY, (2018), vol. 88-90 br. , str. 135-141
Projekat Ministry of Education, Science and Technological Development of Republic of Serbia [OI-171026]; Serbian Academy of Science and Arts (SASA) [F-148]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Ispis zapisa u formatu:TXT | BibTeX