Autori: Dinu Dan
| Naslov | Pulse voltage stress degradation of 4H-SiC Schottky diodes studied by I-V and noise measurements (Proceedings Paper) |
| Autori | Jevtic Milan M Hadzi-Vukovic Jovan M Dinu Dan |
| Info | CAS 2005: INTERNATIONAL SEMICONDUCTOR CONFERENCE VOL 1 AND 2, (2005), vol. br. , str. 369-372 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
