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Naslov Influence of controlling signal parameters and prior stresses on the self-heating of VDMOS power transistors (Article)
Autori Veljkovic Sandra  Mitrovic N  Davidovic Vojkan S  Paskaleva Albena  Spassov Dencho  Marjanovic M  Zivanovic Emilija N  Ristic Goran S  Dankovic Danijel M 
Info MICROELECTRONICS RELIABILITY, (2026), vol. 181 br. , str. -
Projekat Ministry of Science, Technological Development and Innovation of the Republic of Serbia [451-03-137/2025-03/200102]; Horizon Europe Twinning project AIDA4Edge [101160293]; UK Research and Innovation organisation
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa  
Naslov Examination of Impact of NBTIs on Commercial Power P-Channel VDMOS Transistors in Practical Applications (Review)
Autori Dankovic Danijel M  Zivanovic Emilija N  Veselinovic Nevena  Djordjevic Dunja  Petrovic Marija  Tasic Lana  Marjanovic Milos B  Veljkovic Sandra  Mitrovic Nikola I  Davidovic Vojkan S  Ristic Goran S 
Info MICROMACHINES, (2025), vol. 17 br. 1, str. -
Projekat UK Research and Innovation organization, and by the Ministry of Science, Technological Development and Innovation of the Republic of Serbia [451-03-137/2025-03/200102]; German Research Foundation-DFG [551672220]; Horizon Europe Twinning project AIDA4Edge [101160293]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa  
Naslov Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors (Article)
Autori Djoric-Veljkovic Snezana M  Zivanovic Emilija N  Davidovic Vojkan S  Veljkovic Sandra  Mitrovic Nikola I  Ristic Goran S  Paskaleva Albena  Spassov Dencho  Dankovic Danijel M 
Info MICROMACHINES, (2025), vol. 16 br. 1, str. -
Projekat European Union's Horizon 2024 research and innovation program [SPS G5974-"High-k Dielectric RADFET]; European Union's Horizon 2024 research and innovation program through the AIDA4Edge Twinning project [101160293]; Ministry of Science, Technological Development and Innovation of the Republic of Serbia [451-03-65/2024-03/200102, 451-03-65/2024-03/200095]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa  
Naslov Successive Irradiation and Bias Temperature Stress Induced Effects on Commercial P-Channel Power Vdmos Transistors (Article)
Autori Veljkovic Sandra  Mitrovic Nikola I  Davidovic Vojkan S  Zivanovic Emilija N  Ristic Goran S  Dankovic Danijel M 
Info FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS, (2024), vol. 37 br. 4, str. 561-579
Projekat Ministry of Science, Technological Development and Innovations of the Republic of Serbia [451-03-65/2024-03/200102]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science  
Naslov Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications (Article)
Autori Mitrovic Nikola I  Veljkovic Sandra  Davidovic Vojkan S  Djoric-Veljkovic Snezana M  Golubovic Snezana M  Zivanovic Emilija N  Prijic Zoran D  Dankovic Danijel M 
Info MICROELECTRONICS RELIABILITY, (2022), vol. 138 br. , str. -
Projekat European Union [857558]; Republic of Serbia [451-03-9/2021-14/200102]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science  
Naslov Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress (Article)
Autori Veljkovic Sandra  Mitrovic Nikola I  Davidovic Vojkan S  Golubovic Snezana M  Djoric-Veljkovic Snezana M  Paskaleva Albena  Spassov Dencho  Stankovic Srboljub J  Andjelkovic Marko Lj  Prijic Zoran D  Manic Ivica Dj  Prijic Aneta P  Ristic Goran S  Dankovic Danijel M 
Info JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, (2022), vol. 31 br. 18, str. -
Projekat European Union's Horizon 2020 research and innovation program [857558-ELICSIR]; Ministry of Education, Science and Technology Development of the Republic of Serbia [451-03-9/2021-14/200102]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs (Article)
Autori Dankovic Danijel M  Davidovic Vojkan S  Golubovic Snezana M  Veljkovic Sandra  Mitrovic Nikola I  Djoric-Veljkovic Snezana M 
Info MICROELECTRONICS RELIABILITY, (2021), vol. 126 br. , str. -
Projekat Ministry of Education, Science and Technological Development, Serbia [OI-171026, TR-32026]; [F-148]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Radiation Tolerance and Charge Trapping Enhancement of ALD HfO2/Al2O3 Nanolaminated Dielectrics (Article)
Autori Spassov Dencho  Paskaleva Albena  Guziewicz Elzbieta  Davidovic Vojkan S  Stankovic Srboljub J  Djoric-Veljkovic Snezana M  Ivanov Tzvetan  Stanchev Todor  Stojadinovic Ninoslav D 
Info MATERIALS, (2021), vol. 14 br. 4, str. -
Projekat Bulgarian National Scientific Fund [KP-06-H37/32]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov NBTI and irradiation related degradation mechanisms in power VDMOS transistors (Article; Proceedings Paper)
Autori Stojadinovic Ninoslav D  Djoric-Veljkovic Snezana M  Davidovic Vojkan S  Golubovic Snezana M  Stankovic Srboljub J  Prijic Aneta P  Prijic Zoran D  Manic Ivica Dj  Dankovic Danijel M 
Info MICROELECTRONICS RELIABILITY, (2018), vol. 88-90 br. , str. 135-141
Projekat Ministry of Education, Science and Technological Development of Republic of Serbia [OI-171026]; Serbian Academy of Science and Arts (SASA) [F-148]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov A review of pulsed NBTI in P-channel power VDMOSFETs (Review)
Autori Dankovic Danijel M  Manic Ivica Dj  Prijic Aneta P  Davidovic Vojkan S  Prijic Zoran D  Golubovic Snezana M  Djoric-Veljkovic Snezana M  Paskaleva Albena  Spassov Dencho  Stojadinovic Ninoslav D 
Info MICROELECTRONICS RELIABILITY, (2018), vol. 82 br. , str. 28-36
Projekat Ministry of Science of the Republic of Serbia [OI-171026, TR-32026]; SASA [F-148]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
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