Autori: Davidovic Vojkan S
| Naslov | Radiation hardening of power MOSFETs using electrical stress (Article) |
| Autori | Stojadinovic Ninoslav D Djoric-Veljkovic Snezana M Manic Ivica Dj Davidovic Vojkan S Golubovic Snezana M |
| Info | ELECTRONICS LETTERS, (2002), vol. 38 br. 9, str. 431-432 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs (Article) |
| Autori | Stojadinovic Ninoslav D Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Golubovic Snezana M Dimitrijev Sima |
| Info | MICROELECTRONICS RELIABILITY, (2001), vol. 41 br. 9-10, str. 1373-1378 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Analytical modelling of electrical characteristics in gamma-irradiated power VDMOS transistors (Article) |
| Autori | Manic Ivica Dj Pavlovic Zoran Prijic Zoran D Davidovic Vojkan S Stojadinovic Ninoslav D |
| Info | MICROELECTRONICS JOURNAL, (2001), vol. 32 br. 5-6, str. 485-490 |
| Ispravka | ISI/Web of Science Članak Citati: ISI/Web of Science Scopus |
