Autori: Davidovic Vojkan S
| Naslov | Impact of negative bias temperature instabilities on lifetime in p-channel power VDMOSFETs (Proceedings Paper) |
| Autori | Stojadinovic Ninoslav D Dankovic Danijel M Manic Ivica Dj Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M |
| Info | TELSIKS 2007: 8TH INTERNATIONAL CONFERENCE ON TELECOMMUNICATIONS IN MODERN SATELLITE, CABLE AND BROADCASTING SERVICES, VOLS 1 AND 2, (2007), vol. br. , str. 275-282 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
| Naslov | Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors (Article) |
| Autori | Davidovic Vojkan S Kouvatsos DN Stojadinovic Ninoslav D Voutsas AT |
| Info | MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 9-11 , Suppl. , str. 1841 -1845 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs (Article) |
| Autori | Dankovic Danijel M Manic Ivica Dj Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Stojadinovic Ninoslav D |
| Info | MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 9-11 , Suppl. , str. 1400 -1405 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs (Article) |
| Autori | Dankovic Danijel M Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Golubovic Snezana M Stojadinovic Ninoslav D |
| Info | MICROELECTRONICS RELIABILITY, (2006), vol. 46 br. 9-11, str. 1828-1833 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Electrical stressing effects in commercial power VDMOSFETs (Article) |
| Autori | Stojadinovic Ninoslav D Manic Ivica Dj Davidovic Vojkan S Dankovic Danijel M Djoric-Veljkovic Snezana M Golubovic Snezana M Dimitrijev Sima |
| Info | IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, (2006), vol. 153 br. 3, str. 281-288 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Lifetime estimation in NBT stressed P-channel power VDMOSFETs (Proceedings Paper) |
| Autori | Dankovic Danijel M Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Golubovic Snezana M Stojadinovic Ninoslav D |
| Info | 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 645-648 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
| Naslov | Spontaneous recovery in DC gate bias stressed power VDMOSFETs (Proceedings Paper) |
| Autori | Manic Ivica Dj Djoric-Veljkovic Snezana M Davidovic Vojkan S Dankovic Danijel M Golubovic Snezana M Stojadinovic Ninoslav D |
| Info | 2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings, (2006), vol. br. , str. 639-644 |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science |
| Naslov | Negative bias temperature instability mechanisms in p-channel power VDMOSFETs (Article) |
| Autori | Stojadinovic Ninoslav D Dankovic Danijel M Djoric-Veljkovic Snezana M Davidovic Vojkan S Manic Ivica Dj Golubovic Snezana M |
| Info | MICROELECTRONICS RELIABILITY, (2005), vol. 45 br. 9-11, str. 1343-1348 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Effects of electrical stressing in power VDMOSFETS (Article) |
| Autori | Stojadinovic Ninoslav D Manic Ivica Dj Davidovic Vojkan S Dankovic Danijel M Djoric-Veljkovic Snezana M Golubovic Snezana M Dimitrijev Sima |
| Info | MICROELECTRONICS RELIABILITY, (2005), vol. 45 br. 1, str. 115-122 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors (Article) |
| Autori | Kouvatsos DN Davidovic Vojkan S Papaioannou GJ Stojadinovic Ninoslav D Michalas L Exarchos M Voutsas AT Goustouridis D |
| Info | MICROELECTRONICS RELIABILITY, (2004), vol. 44 br. 9-11, str. 1631-1636 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
