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Autori: Davidovic Vojkan S

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Naslov Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET (Article)
Autori Dankovic Danijel M  Stojadinovic Ninoslav D  Prijic Zoran D  Manic Ivica Dj  Davidovic Vojkan S  Prijic Aneta P  Djoric-Veljkovic Snezana M  Golubovic Snezana M 
Info CHINESE PHYSICS B, (2015), vol. 24 br. 10, str. -
Projekat Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026]; Ei PCB Factory, Nis
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science  
Naslov Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation (Article)
Autori Dankovic Danijel M  Manic Ivica Dj  Prijic Aneta P  Djoric-Veljkovic Snezana M  Davidovic Vojkan S  Stojadinovic Ninoslav D  Prijic Zoran D  Golubovic Snezana M 
Info SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (2015), vol. 30 br. 10, str. -
Projekat Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science  
Naslov Annealing influence on recovery of electrically stressed power vertical double-diffused metal oxide semiconductor transistors (Article)
Autori Djoric-Veljkovic Snezana M  Manic Ivica Dj  Davidovic Vojkan S  Dankovic Danijel M  Golubovic Snezana M  Stojadinovic Ninoslav D 
Info JAPANESE JOURNAL OF APPLIED PHYSICS, (2015), vol. 54 br. 6, str. -
Projekat Ministry of Education, Science and Technological Development of the Republic of Serbia [OI171026]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science  
Naslov The Comparison of Gamma-Radiation and Electrical Stress Influences on Oxide and Interface Defects in Power Vdmosfet (Article)
Autori Djoric-Veljkovic Snezana M  Manic Ivica Dj  Davidovic Vojkan S  Dankovic Danijel M  Golubovic Snezana M  Stojadinovic Ninoslav D 
Info NUCLEAR TECHNOLOGY & RADIATION PROTECTION, (2013), vol. 28 br. 4, str. 406-414
Projekat Ministry of Education, Science and Technological Development of the Republic of Serbia [OI171026]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs (Article)
Autori Dankovic Danijel M  Manic Ivica Dj  Prijic Aneta P  Davidovic Vojkan S  Djoric-Veljkovic Snezana M  Golubovic Snezana M  Prijic Zoran D  Stojadinovic Ninoslav D 
Info INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, (2013), vol. 43 br. 1, str. 58-66
Projekat Ministry of Education and Science of the Republic of Serbia [OI171026, TR32026]; Ei PCB Factory, Nis, Serbia
Ispravka ISI/Web of Science   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions (Article)
Autori Manic Ivica Dj  Dankovic Danijel M  Prijic Aneta P  Davidovic Vojkan S  Djoric-Veljkovic Snezana M  Golubovic Snezana M  Prijic Zoran D  Stojadinovic Ninoslav D 
Info MICROELECTRONICS RELIABILITY, (2011), vol. 51 br. 9-11, str. 1540-1543
Projekat Ministry of Science of the Republic of Serbia[0171026, TR32026]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Annealing of Radiation-induced Defects in Burn-in Stressed Power Vdmosfets (Article)
Autori Djoric-Veljkovic Snezana M  Manic Ivica Dj  Davidovic Vojkan S  Dankovic Danijel M  Golubovic Snezana M  Stojadinovic Ninoslav D 
Info NUCLEAR TECHNOLOGY & RADIATION PROTECTION, (2011), vol. 26 br. 1, str. 18-24
Projekat Ministry of Science and Technological Development of Republic of Serbia
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Turn-Around of Threshold Voltage in Gate Bias Stressed p-Channel Power Vertical Double-Diffused Metal-Oxide-Semiconductor Transistors (Article)
Autori Davidovic Vojkan S  Stojadinovic Ninoslav D  Dankovic Danijel M  Golubovic Snezana M  Manic Ivica Dj  Djoric-Veljkovic Snezana M  Dimitrijev Sima 
Info JAPANESE JOURNAL OF APPLIED PHYSICS, (2008), vol. 47 br. 8, str. 6272-6276
Projekat Ministry of Science of the Republic of Serbia
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs (Article)
Autori Manic Ivica Dj  Djoric-Veljkovic Snezana M  Davidovic Vojkan S  Dankovic Danijel M  Golubovic Snezana M  Stojadinovic Ninoslav D 
Info IET CIRCUITS DEVICES & SYSTEMS, (2008), vol. 2 br. 2, str. 213-221
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
Naslov Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors (Article)
Autori Davidovic Vojkan S  Kouvatsos DN  Stojadinovic Ninoslav D  Voutsas AT 
Info MICROELECTRONICS RELIABILITY, (2007), vol. 47 br. 9-11 , Suppl. , str. 1841 -1845
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa   Citati: ISI/Web of Science   Scopus  
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