Autori: Chattopadhyay S
Naslov | A model for capacitance reconstruction from measured lossy MOS capacitance-voltage characteristics (Article) |
Autori | Kwa KSK Chattopadhyay S Jankovic Nebojsa D Olsen SH Driscoll LS O'Neill AG |
Info | SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (2003), vol. 18 br. 2, str. 82-87 |
Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |