Autori: Carulli Jr John M
| Naslov | Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond (Article) |
| Autori | Huang Ke Liu Yu Korolija Nenad Carulli Jr John M Makris Yiorgos |
| Info | IEEE DESIGN & TEST, (2024), vol. 41 br. 2, str. 15-22 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa |
