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Naslov A Comprehensive Overview of the Temperature-Dependent Modeling of the High-Power GaN HEMT Technology Using mm-Wave Scattering Parameter Measurements (Invited Paper) (Article)
Autori Crupi Giovanni  Latino Mariangela  Gugliandolo Giovanni  Marinkovic Zlatica D  Cai Jialin  Bosi Gianni  Raffo Antonio  Fazio Enza  Donato Nicola 
Info ELECTRONICS, (2023), vol. 12 br. 8, str. -
Projekat Italian Ministry of University and Research (MUR) through the PRIN [2017FL8C9N]; Ministry of Science, Technological Development and Innovations of the Republic of Serbia; GaN4AP (GaN for Advanced Power Applications) project [CUP: B82C21001520008]
Ispravka ISI/Web of Science   Članak   Elečas   Rang časopisa  
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