Autori: Antonakos A
| Naslov | Micro-Raman depth profiling of silicon amorphization induced by high-energy ion channeling implantation (Article) |
| Autori | Eric Marko V Petrovic Srdjan M Kokkoris M Liarokapis E Antonakos A Telecki Igor N |
| Info | JOURNAL OF RAMAN SPECTROSCOPY, (2013), vol. 44 br. 3, str. 496-500 |
| Projekat | Ministry of Education and Science of Serbia [45006]; European Commission [227012] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
