Autori: Veljkovic Sandra
Naslov | Proposal of dual-gate oxide layered with HfO2: Comparative results with SiO2-RadFET (Article) |
Autori | Yilmaz Ercan Ristic Goran S Turan Rasit Yilmaz Ozan Gurer Umutcan Lugonja Predrag Budak Erhan Marjanovic Milos B Veljkovic Sandra Mutale Alex Kahraman Aysegul |
Info | RADIATION PHYSICS AND CHEMISTRY, (2025), vol. 232 br. , str. - |
Projekat | North Atlantic Treaty Organization (NATO) SPS MYP [G5974] |
Ispravka | ISI/Web of Science Članak Elečas Rang časopisa |
Naslov | The SPICE Modeling of a Radiation Sensor Based on a MOSFET with a Dielectric HfO2/SiO2 Double-Layer (Article) |
Autori | Marjanovic Milos B Ilic Stefan D Veljkovic Sandra Mitrovic Nikola I Gurer Umutcan Yilmaz Ozan Kahraman Aysegul Aktag Aliekber Karacali Huseyin Budak Erhan Dankovic Danijel M Ristic Goran S Yilmaz Ercan |
Info | SENSORS, (2025), vol. 25 br. 2, str. - |
Projekat | North Atlantic Treaty Organization (NATO) SPS MYP; Ministry of Science, Technological Development and Innovation of the Republic of Serbia [451-03-65/2024-03/200102, 451-03-66/2024-03/200026]; [G5974] |
Ispravka | ISI/Web of Science Članak Elečas Rang časopisa |
Naslov | Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors (Article) |
Autori | Djoric-Veljkovic Snezana M Zivanovic Emilija N Davidovic Vojkan S Veljkovic Sandra Mitrovic Nikola I Ristic Goran S Paskaleva Albena Spassov Dencho Dankovic Danijel M |
Info | MICROMACHINES, (2025), vol. 16 br. 1, str. - |
Projekat | European Union's Horizon 2024 research and innovation program [SPS G5974-"High-k Dielectric RADFET]; European Union's Horizon 2024 research and innovation program through the AIDA4Edge Twinning project [101160293]; Ministry of Science, Technological Development and Innovation of the Republic of Serbia [451-03-65/2024-03/200102, 451-03-65/2024-03/200095] |
Ispravka | ISI/Web of Science Članak Elečas Rang časopisa |
Naslov | Successive Irradiation and Bias Temperature Stress Induced Effects on Commercial P-Channel Power Vdmos Transistors (Article) |
Autori | Veljkovic Sandra Mitrovic Nikola I Davidovic Vojkan S Zivanovic Emilija N Ristic Goran S Dankovic Danijel M |
Info | FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS, (2024), vol. 37 br. 4, str. 561-579 |
Projekat | Ministry of Science, Technological Development and Innovations of the Republic of Serbia [451-03-65/2024-03/200102] |
Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science |
Naslov | A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress (Article) |
Autori | Zivanovic Emilija N Veljkovic Sandra Mitrovic Nikola I Jovanovic Igor D Djoric-Veljkovic Snezana M Paskaleva Albena Spassov Dencho Dankovic Danijel M |
Info | MICROMACHINES, (2024), vol. 15 br. 4, str. - |
Projekat | Serbian Ministry of Science, Technological Development and Innovation |
Ispravka | ISI/Web of Science Članak Elečas Rang časopisa |
Naslov | Self-heating of stressed VDMOS devices under specific operating conditions (Article) |
Autori | Veljkovic Sandra Mitrovic Nikola I Jovanovic Igor D Zivanovic Emilija N Paskaleva Albena Spassov Dencho Mancic Dragan D Dankovic Danijel M |
Info | MICROELECTRONICS RELIABILITY, (2023), vol. 150 br. , str. - |
Projekat | Ministry of Education, Science, Technological Development and Innovation of the Republic of Serbia [451-03-9/2021-14/200102]; Bulgarian National Scientific Fund [KP-06-H37/32]; [SPS G5974] |
Ispravka | ISI/Web of Science Članak Elečas Rang časopisa |
Naslov | Implementation and Testing of Websocket Protocol in Esp32 Based Iot Systems (Article) |
Autori | Mitrovic Nikola I Djordjevic Milan Veljkovic Sandra Dankovic Danijel M |
Info | FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS, (2023), vol. 36 br. 2, str. 267-284 |
Projekat | Ministry of Education, Science and Technological Development of the Republic of Serbia [451-03-9/2021-14/200102] |
Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science |
Naslov | Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications (Article) |
Autori | Mitrovic Nikola I Veljkovic Sandra Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Zivanovic Emilija N Prijic Zoran D Dankovic Danijel M |
Info | MICROELECTRONICS RELIABILITY, (2022), vol. 138 br. , str. - |
Projekat | European Union [857558]; Republic of Serbia [451-03-9/2021-14/200102] |
Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science |
Naslov | Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress (Article) |
Autori | Veljkovic Sandra Mitrovic Nikola I Davidovic Vojkan S Golubovic Snezana M Djoric-Veljkovic Snezana M Paskaleva Albena Spassov Dencho Stankovic Srboljub J Andjelkovic Marko Lj Prijic Zoran D Manic Ivica Dj Prijic Aneta P Ristic Goran S Dankovic Danijel M |
Info | JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, (2022), vol. 31 br. 18, str. - |
Projekat | European Union's Horizon 2020 research and innovation program [857558-ELICSIR]; Ministry of Education, Science and Technology Development of the Republic of Serbia [451-03-9/2021-14/200102] |
Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
Naslov | Study of Breakdown Voltage Stability of Gas-Filled Surge Arresters in the Presence of Gamma Radiation (Article) |
Autori | Zivanovic Emilija N Zivkovic Marija Veljkovic Sandra |
Info | ELECTRONICS, (2022), vol. 11 br. 15, str. - |
Projekat | Ministry of Education, Science and Technological Development of Republic of Serbia [451-03-68/202214/200102] |
Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |