Autori: Rothleitner H
| Naslov | The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements (Proceedings Paper) |
| Autori | Hadzi-Vukovic Jovan M Jevtic Milan M Glavanovics M Rothleitner H |
| Info | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, (2008), vol. 205 br. 11, str. 2544-2547 |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science |
