Autori: Mitrovic Nikola I
| Naslov | The SPICE Modeling of a Radiation Sensor Based on a MOSFET with a Dielectric HfO2/SiO2 Double-Layer (Article) |
| Autori | Marjanovic Milos B Ilic Stefan D Veljkovic Sandra Mitrovic Nikola I Gurer Umutcan Yilmaz Ozan Kahraman Aysegul Aktag Aliekber Karacali Huseyin Budak Erhan Dankovic Danijel M Ristic Goran S Yilmaz Ercan |
| Info | SENSORS, (2025), vol. 25 br. 2, str. - |
| Projekat | North Atlantic Treaty Organization (NATO) SPS MYP; Ministry of Science, Technological Development and Innovation of the Republic of Serbia [451-03-65/2024-03/200102, 451-03-66/2024-03/200026]; [G5974] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa |
| Naslov | Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors (Article) |
| Autori | Djoric-Veljkovic Snezana M Zivanovic Emilija N Davidovic Vojkan S Veljkovic Sandra Mitrovic Nikola I Ristic Goran S Paskaleva Albena Spassov Dencho Dankovic Danijel M |
| Info | MICROMACHINES, (2025), vol. 16 br. 1, str. - |
| Projekat | European Union's Horizon 2024 research and innovation program [SPS G5974-"High-k Dielectric RADFET]; European Union's Horizon 2024 research and innovation program through the AIDA4Edge Twinning project [101160293]; Ministry of Science, Technological Development and Innovation of the Republic of Serbia [451-03-65/2024-03/200102, 451-03-65/2024-03/200095] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa |
| Naslov | Thermal Annealing-Induced Recovery of the VT of Irradiated Commercial MOS Transistors (Article; Early Access) |
| Autori | Mitrovic Nikola I Guirado Damian Dankovic Danijel M Palma Alberto J Ristic Goran S Carvajal Miguel A |
| Info | JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, (2024), vol. br. , str. - |
| Projekat | Ministry of Science, Technological Development and Innovations of the Republic of Serbia [451-03-65/2024-03/200102]; European Union's Horizon 2020 research and innovation program [857558 - ELICSIR] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: |
| Naslov | A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress (Article) |
| Autori | Zivanovic Emilija N Veljkovic Sandra Mitrovic Nikola I Jovanovic Igor D Djoric-Veljkovic Snezana M Paskaleva Albena Spassov Dencho Dankovic Danijel M |
| Info | MICROMACHINES, (2024), vol. 15 br. 4, str. - |
| Projekat | Serbian Ministry of Science, Technological Development and Innovation |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa |
| Naslov | Self-heating of stressed VDMOS devices under specific operating conditions (Article) |
| Autori | Veljkovic Sandra Mitrovic Nikola I Jovanovic Igor D Zivanovic Emilija N Paskaleva Albena Spassov Dencho Mancic Dragan D Dankovic Danijel M |
| Info | MICROELECTRONICS RELIABILITY, (2023), vol. 150 br. , str. - |
| Projekat | Ministry of Education, Science, Technological Development and Innovation of the Republic of Serbia [451-03-9/2021-14/200102]; Bulgarian National Scientific Fund [KP-06-H37/32]; [SPS G5974] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa |
| Naslov | The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering (Article) |
| Autori | Dankovic Danijel M Marjanovic Milos B Mitrovic Nikola I Zivanovic Emilija N Dankovic Milan Prijic Aneta P Prijic Zoran D |
| Info | IEEE TRANSACTIONS ON EDUCATION, (2023), vol. 66 br. 2, str. 146-155 |
| Projekat | Serbian Ministry of Education, Science, and Technological Development [451-0368/2022-14/200102] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications (Article) |
| Autori | Mitrovic Nikola I Veljkovic Sandra Davidovic Vojkan S Djoric-Veljkovic Snezana M Golubovic Snezana M Zivanovic Emilija N Prijic Zoran D Dankovic Danijel M |
| Info | MICROELECTRONICS RELIABILITY, (2022), vol. 138 br. , str. - |
| Projekat | European Union [857558]; Republic of Serbia [451-03-9/2021-14/200102] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science |
| Naslov | Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress (Article) |
| Autori | Veljkovic Sandra Mitrovic Nikola I Davidovic Vojkan S Golubovic Snezana M Djoric-Veljkovic Snezana M Paskaleva Albena Spassov Dencho Stankovic Srboljub J Andjelkovic Marko Lj Prijic Zoran D Manic Ivica Dj Prijic Aneta P Ristic Goran S Dankovic Danijel M |
| Info | JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, (2022), vol. 31 br. 18, str. - |
| Projekat | European Union's Horizon 2020 research and innovation program [857558-ELICSIR]; Ministry of Education, Science and Technology Development of the Republic of Serbia [451-03-9/2021-14/200102] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs (Article) |
| Autori | Dankovic Danijel M Davidovic Vojkan S Golubovic Snezana M Veljkovic Sandra Mitrovic Nikola I Djoric-Veljkovic Snezana M |
| Info | MICROELECTRONICS RELIABILITY, (2021), vol. 126 br. , str. - |
| Projekat | Ministry of Education, Science and Technological Development, Serbia [OI-171026, TR-32026]; [F-148] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
| Naslov | Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method (Article) |
| Autori | Mitrovic Nikola I Dankovic Danijel M Randjelovic Branislav M Prijic Zoran D Stojadinovic Ninoslav D |
| Info | INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, (2020), vol. 50 br. 3, str. 205-214 |
| Projekat | Ministry of Education, Science and Technological Development of the Republic of Serbia; Serbian Academy of Science and Arts |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
