Autori: Krajewski T
| Naslov | Electrical and Charge Trapping Properties of HfO2/Al2O3 Multilayer Dielectric Stacks (Proceedings Paper) |
| Autori | Davidovic Vojkan S Paskaleva Albena Spassov Dencho Guziewicz Elzbieta Krajewski T Golubovic Snezana M Djoric-Veljkovic Snezana M Manic Ivica Dj Dankovic Danijel M Stojadinovic Ninoslav D |
| Info | 2017 IEEE 30TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL), (2017), vol. br. , str. 143-146 |
| Projekat | SASA [F-148] |
| Ispravka | ISI/Web of Science Citati: ISI/Web of Science Scopus |
