Autori: Kovcevic Milojko
| Naslov | Defect generation in non-nitrided and nitrided sputtered gate oxides under post-irradiation Fowler-Nordheim constant current stress (Article) |
| Autori | Jelenkovic Emil V Kovcevic Milojko Jha Shrawan K Tong KY Nikezic Dragoslav R |
| Info | MICROELECTRONIC ENGINEERING, (2013), vol. 104 br. , str. 90-94 |
| Projekat | Hong Kong Polytechnic University; Ministry of Science and Technology Development of Republic of Serbia [04311] |
| Ispravka | ISI/Web of Science Članak Elečas Rang časopisa Citati: ISI/Web of Science Scopus |
