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Naslov Thermal Annealing-Induced Recovery of the VT of Irradiated Commercial MOS Transistors (Article; Early Access)
Autori Mitrovic Nikola I  Guirado Damian  Dankovic Danijel M  Palma Alberto J  Ristic Goran S  Carvajal Miguel A 
Info JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, (2024), vol. br. , str. -
Projekat Ministry of Science, Technological Development and Innovations of the Republic of Serbia [451-03-65/2024-03/200102]; European Union's Horizon 2020 research and innovation program [857558 - ELICSIR]
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