Veljkovic Sandra,Mitrovic N,Davidovic Vojkan S,Paskaleva Albena,Spassov Dencho,Marjanovic M,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M (2026) Influence of controlling signal parameters and prior stresses on the self-heating of VDMOS power transistors, MICROELECTRONICS RELIABILITY, vol. 181, br. , str. - (Article) 

Dankovic Danijel M,Zivanovic Emilija N,Veselinovic Nevena,Djordjevic Dunja,Petrovic Marija,Tasic Lana,Marjanovic Milos B,Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Ristic Goran S (2025) Examination of Impact of NBTIs on Commercial Power P-Channel VDMOS Transistors in Practical Applications, MICROMACHINES, vol. 17, br. 1, str. - (Review) 

Djoric-Veljkovic Snezana M,Zivanovic Emilija N,Davidovic Vojkan S,Veljkovic Sandra,Mitrovic Nikola I,Ristic Goran S,Paskaleva Albena,Spassov Dencho,Dankovic Danijel M (2025) Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors, MICROMACHINES, vol. 16, br. 1, str. - (Article) 

Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M (2024) Successive Irradiation and Bias Temperature Stress Induced Effects on Commercial P-Channel Power Vdmos Transistors, FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS, vol. 37, br. 4, str. 561-579 (Article) 

Zivanovic Emilija N,Veljkovic Sandra,Mitrovic Nikola I,Jovanovic Igor D,Djoric-Veljkovic Snezana M,Paskaleva Albena,Spassov Dencho,Dankovic Danijel M (2024) A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress, MICROMACHINES, vol. 15, br. 4, str. - (Article) 

Veljkovic Sandra,Mitrovic Nikola I,Jovanovic Igor D,Zivanovic Emilija N,Paskaleva Albena,Spassov Dencho,Mancic Dragan D,Dankovic Danijel M (2023) Self-heating of stressed VDMOS devices under specific operating conditions, MICROELECTRONICS RELIABILITY, vol. 150, br. , str. - (Article) 

Dankovic Danijel M,Marjanovic Milos B,Mitrovic Nikola I,Zivanovic Emilija N,Dankovic Milan,Prijic Aneta P,Prijic Zoran D (2023) The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering, IEEE TRANSACTIONS ON EDUCATION, vol. 66, br. 2, str. 146-155 (Article) 

Mitrovic Nikola I,Veljkovic Sandra,Davidovic Vojkan S,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Zivanovic Emilija N,Prijic Zoran D,Dankovic Danijel M (2022) Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications, MICROELECTRONICS RELIABILITY, vol. 138, br. , str. - (Article) 

Zivanovic Emilija N,Zivkovic Marija,Veljkovic Sandra (2022) Study of Breakdown Voltage Stability of Gas-Filled Surge Arresters in the Presence of Gamma Radiation, ELECTRONICS, vol. 11, br. 15, str. - (Article) 

Pejovic Milic M,Zivanovic Emilija N,Stojanovic Milan D (2022) Xenon-filled diode performance under influence of low doses of gamma radiation, APPLIED RADIATION AND ISOTOPES, vol. 184, br. , str. - (Article) 

Pejovic Milic M,Zivanovic Emilija N,Belic Cedomir I (2021) The Possibility for Gamma and UV Radiation Detection Based on Electrical Breakdown Time Delay Measurement in Krypton and Xenon Filled Diodes, NUCLEAR TECHNOLOGY & RADIATION PROTECTION, vol. 36, br. 3, str. 243-248 (Article) 

Zivanovic Emilija N,Zivkovic Marija,Pejovic Milic M (2021) The Evolution of Breakdown Voltage and Delay Time Under High Overvoltage for Different Types of Surge Arresters, FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS, vol. 34, br. 2, str. 307-322 (Article) 

Pejovic Milic M,Zivanovic Emilija N,Zivanovic Milos Z (2020) Investigation of Xenon-Filled Tube Breakdown Voltage and Delay Response as Possible Dosimetric Parameters for Small Gamma Ray Air Kerma Rates, RADIATION PROTECTION DOSIMETRY, vol. 190, br. 1, str. 84-89 (Article) 

Zivanovic Emilija N,Maluckov Cedomir A (2018) Investigation of statistical behaviour of electrical breakdown voltage distribution for nitrogen-filled diode at 13.3mbar pressure, CONTRIBUTIONS TO PLASMA PHYSICS, vol. 58, br. 4, str. 293-301 (Article) 

Zivanovic Emilija N (2014) Influence of combined gas and vacuum breakdown mechanisms on memory effect in nitrogen, VACUUM, vol. 107, br. , str. 62-67 (Article) 

Pejovic Momcilo M,Zivanovic Emilija N,Pejovic Milic M,Nesic Nikola T,Kovacevic Dragan (2012) Investigation of breakdown voltage and electrical breakdown time delay in air-filled tube in presence of combined gas and vacuum breakdown mechanism, VACUUM, vol. 86, br. 12, str. 1860-1866 (Article) 

Pejovic Momcilo M,Nesic Nikola T,Pejovic Milic M,Zivanovic Emilija N (2012) Afterglow processes responsible for memory effect in nitrogen, JOURNAL OF APPLIED PHYSICS, vol. 112, br. 1, str. - (Article) 

Zivanovic Emilija N,Pejovic Momcilo M,Pejovic Milic M,Nesic Nikola T (2011) Analysis of Statistical Nature of Electrical Breakdown Time Delay in Nitrogen at 6.6 mbar Pressure in Presence of Positive Ions and N((4)S) Atoms, CONTRIBUTIONS TO PLASMA PHYSICS, vol. 51, br. 9, str. 877-884 (Article) 

Nesic Nikola T,Pejovic Momcilo M,Pejovic Milic M,Zivanovic Emilija N (2011) The influence of additional electrons on memory effect in nitrogen at low pressures, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 44, br. 9, str. - (Article) 

Pejovic Momcilo M,Zivanovic Emilija N,Pejovic Milic M,Karamarkovic Jugoslav P (2010) Analysis of processes responsible for the memory effect in air at low pressures, PLASMA SOURCES SCIENCE & TECHNOLOGY, vol. 19, br. 4, str. - (Article) 

Pejovic Momcilo M,Zivanovic Emilija N,Pejovic Milic M (2004) Kinetics of ions and neutral active states in the afterglow and their influence on the memory effect in nitrogen at low pressures, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 37, br. 2, str. 200-210 (Article)