@ARTICLE{
author={Veljkovic Sandra,Mitrovic N,Davidovic Vojkan S,Paskaleva Albena,Spassov Dencho,Marjanovic M,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M},
year={2026},
title={Influence of controlling signal parameters and prior stresses on the self-heating of VDMOS power transistors},
journal={MICROELECTRONICS RELIABILITY},
volume={181},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Zivanovic Emilija N,Veselinovic Nevena,Djordjevic Dunja,Petrovic Marija,Tasic Lana,Marjanovic Milos B,Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Ristic Goran S},
year={2025},
title={Examination of Impact of NBTIs on Commercial Power P-Channel VDMOS Transistors in Practical Applications},
journal={MICROMACHINES},
volume={17},
number={1},
pages={-},
document_type={Review},
} 

@ARTICLE{
author={Djoric-Veljkovic Snezana M,Zivanovic Emilija N,Davidovic Vojkan S,Veljkovic Sandra,Mitrovic Nikola I,Ristic Goran S,Paskaleva Albena,Spassov Dencho,Dankovic Danijel M},
year={2025},
title={Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors},
journal={MICROMACHINES},
volume={16},
number={1},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M},
year={2024},
title={Successive Irradiation and Bias Temperature Stress Induced Effects on Commercial P-Channel Power Vdmos Transistors},
journal={FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS},
volume={37},
number={4},
pages={561-579},
document_type={Article},
} 

@ARTICLE{
author={Zivanovic Emilija N,Veljkovic Sandra,Mitrovic Nikola I,Jovanovic Igor D,Djoric-Veljkovic Snezana M,Paskaleva Albena,Spassov Dencho,Dankovic Danijel M},
year={2024},
title={A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress},
journal={MICROMACHINES},
volume={15},
number={4},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Veljkovic Sandra,Mitrovic Nikola I,Jovanovic Igor D,Zivanovic Emilija N,Paskaleva Albena,Spassov Dencho,Mancic Dragan D,Dankovic Danijel M},
year={2023},
title={Self-heating of stressed VDMOS devices under specific operating conditions},
journal={MICROELECTRONICS RELIABILITY},
volume={150},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Dankovic Danijel M,Marjanovic Milos B,Mitrovic Nikola I,Zivanovic Emilija N,Dankovic Milan,Prijic Aneta P,Prijic Zoran D},
year={2023},
title={The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering},
journal={IEEE TRANSACTIONS ON EDUCATION},
volume={66},
number={2},
pages={146-155},
document_type={Article},
} 

@ARTICLE{
author={Mitrovic Nikola I,Veljkovic Sandra,Davidovic Vojkan S,Djoric-Veljkovic Snezana M,Golubovic Snezana M,Zivanovic Emilija N,Prijic Zoran D,Dankovic Danijel M},
year={2022},
title={Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications},
journal={MICROELECTRONICS RELIABILITY},
volume={138},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Zivanovic Emilija N,Zivkovic Marija,Veljkovic Sandra},
year={2022},
title={Study of Breakdown Voltage Stability of Gas-Filled Surge Arresters in the Presence of Gamma Radiation},
journal={ELECTRONICS},
volume={11},
number={15},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Zivanovic Emilija N,Stojanovic Milan D},
year={2022},
title={Xenon-filled diode performance under influence of low doses of gamma radiation},
journal={APPLIED RADIATION AND ISOTOPES},
volume={184},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Zivanovic Emilija N,Belic Cedomir I},
year={2021},
title={The Possibility for Gamma and UV Radiation Detection Based on Electrical Breakdown Time Delay Measurement in Krypton and Xenon Filled Diodes},
journal={NUCLEAR TECHNOLOGY & RADIATION PROTECTION},
volume={36},
number={3},
pages={243-248},
document_type={Article},
} 

@ARTICLE{
author={Zivanovic Emilija N,Zivkovic Marija,Pejovic Milic M},
year={2021},
title={The Evolution of Breakdown Voltage and Delay Time Under High Overvoltage for Different Types of Surge Arresters},
journal={FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS},
volume={34},
number={2},
pages={307-322},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Zivanovic Emilija N,Zivanovic Milos Z},
year={2020},
title={Investigation of Xenon-Filled Tube Breakdown Voltage and Delay Response as Possible Dosimetric Parameters for Small Gamma Ray Air Kerma Rates},
journal={RADIATION PROTECTION DOSIMETRY},
volume={190},
number={1},
pages={84-89},
document_type={Article},
} 

@ARTICLE{
author={Zivanovic Emilija N,Maluckov Cedomir A},
year={2018},
title={Investigation of statistical behaviour of electrical breakdown voltage distribution for nitrogen-filled diode at 13.3mbar pressure},
journal={CONTRIBUTIONS TO PLASMA PHYSICS},
volume={58},
number={4},
pages={293-301},
document_type={Article},
} 

@ARTICLE{
author={Zivanovic Emilija N},
year={2014},
title={Influence of combined gas and vacuum breakdown mechanisms on memory effect in nitrogen},
journal={VACUUM},
volume={107},
number={},
pages={62-67},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Zivanovic Emilija N,Pejovic Milic M,Nesic Nikola T,Kovacevic Dragan},
year={2012},
title={Investigation of breakdown voltage and electrical breakdown time delay in air-filled tube in presence of combined gas and vacuum breakdown mechanism},
journal={VACUUM},
volume={86},
number={12},
pages={1860-1866},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Nesic Nikola T,Pejovic Milic M,Zivanovic Emilija N},
year={2012},
title={Afterglow processes responsible for memory effect in nitrogen},
journal={JOURNAL OF APPLIED PHYSICS},
volume={112},
number={1},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Zivanovic Emilija N,Pejovic Momcilo M,Pejovic Milic M,Nesic Nikola T},
year={2011},
title={Analysis of Statistical Nature of Electrical Breakdown Time Delay in Nitrogen at 6.6 mbar Pressure in Presence of Positive Ions and N((4)S) Atoms},
journal={CONTRIBUTIONS TO PLASMA PHYSICS},
volume={51},
number={9},
pages={877-884},
document_type={Article},
} 

@ARTICLE{
author={Nesic Nikola T,Pejovic Momcilo M,Pejovic Milic M,Zivanovic Emilija N},
year={2011},
title={The influence of additional electrons on memory effect in nitrogen at low pressures},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={44},
number={9},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Zivanovic Emilija N,Pejovic Milic M,Karamarkovic Jugoslav P},
year={2010},
title={Analysis of processes responsible for the memory effect in air at low pressures},
journal={PLASMA SOURCES SCIENCE & TECHNOLOGY},
volume={19},
number={4},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Zivanovic Emilija N,Pejovic Milic M},
year={2004},
title={Kinetics of ions and neutral active states in the afterglow and their influence on the memory effect in nitrogen at low pressures},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={37},
number={2},
pages={200-210},
document_type={Article},
}