Jelenkovic Emil V,Kovacevic Milan S,Stupar Dragan Z,Jha Shrawan K,Bajic Jovan S,Tong KY (2014) Positive bias temperature instability of irradiated n-channel thin film transistors, THIN SOLID FILMS, vol. 556, br. , str. 535-538 (Article) 

Jelenkovic Emil V,Kovcevic Milojko,Jha Shrawan K,Tong KY,Nikezic Dragoslav R (2013) Defect generation in non-nitrided and nitrided sputtered gate oxides under post-irradiation Fowler-Nordheim constant current stress, MICROELECTRONIC ENGINEERING, vol. 104, br. , str. 90-94 (Article) 

Jelenkovic Emil V,Ristic Goran S,Pejovic Milic M,Jevtic Milan M,Jha Shrawan K,Videnovic-Misic Mirjana S,Pejovic Momcilo M,Tong KY (2011) Effect of fluorination and hydrogenation by ion implantation on reliability of poly-Si TFTs under gamma irradiation, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 44, br. 1, str. - (Article) 

Jha Shrawan K,Jelenkovic Emil V,Pejovic Milic M,Ristic Goran S,Pejovic Momcilo M,Tong KY,Surya C,Bello I,Zhang WJ (2009) Stability of submicron AlGaN/GaN HEMT devices irradiated by gamma rays, MICROELECTRONIC ENGINEERING, vol. 86, br. 1, str. 37-40 (Article) 

Jelenkovic Emil V,Jevtic Milan M,Tong KY,Pang GKH,Cheung WY,Jha Shrawan K (2007) On temperature coefficient of resistance of boron-doped SiGe films deposited by sputtering, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, vol. 10, br. 4-5, str. 143-149 (Article) 

Jevtic Milan M,Jelenkovic Emil V,Tong KY,Pang GKH (2006) Noise and structural properties of reactively sputtered RuO2 thin films, THIN SOLID FILMS, vol. 496, br. 2, str. 214-220 (Article)