@ARTICLE{
author={Jelenkovic Emil V,Kovacevic Milan S,Stupar Dragan Z,Jha Shrawan K,Bajic Jovan S,Tong KY},
year={2014},
title={Positive bias temperature instability of irradiated n-channel thin film transistors},
journal={THIN SOLID FILMS},
volume={556},
number={},
pages={535-538},
document_type={Article},
} 

@ARTICLE{
author={Jelenkovic Emil V,Kovcevic Milojko,Jha Shrawan K,Tong KY,Nikezic Dragoslav R},
year={2013},
title={Defect generation in non-nitrided and nitrided sputtered gate oxides under post-irradiation Fowler-Nordheim constant current stress},
journal={MICROELECTRONIC ENGINEERING},
volume={104},
number={},
pages={90-94},
document_type={Article},
} 

@ARTICLE{
author={Jelenkovic Emil V,Ristic Goran S,Pejovic Milic M,Jevtic Milan M,Jha Shrawan K,Videnovic-Misic Mirjana S,Pejovic Momcilo M,Tong KY},
year={2011},
title={Effect of fluorination and hydrogenation by ion implantation on reliability of poly-Si TFTs under gamma irradiation},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={44},
number={1},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Jha Shrawan K,Jelenkovic Emil V,Pejovic Milic M,Ristic Goran S,Pejovic Momcilo M,Tong KY,Surya C,Bello I,Zhang WJ},
year={2009},
title={Stability of submicron AlGaN/GaN HEMT devices irradiated by gamma rays},
journal={MICROELECTRONIC ENGINEERING},
volume={86},
number={1},
pages={37-40},
document_type={Article},
} 

@ARTICLE{
author={Jelenkovic Emil V,Jevtic Milan M,Tong KY,Pang GKH,Cheung WY,Jha Shrawan K},
year={2007},
title={On temperature coefficient of resistance of boron-doped SiGe films deposited by sputtering},
journal={MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING},
volume={10},
number={4-5},
pages={143-149},
document_type={Article},
} 

@ARTICLE{
author={Jevtic Milan M,Jelenkovic Emil V,Tong KY,Pang GKH},
year={2006},
title={Noise and structural properties of reactively sputtered RuO2 thin films},
journal={THIN SOLID FILMS},
volume={496},
number={2},
pages={214-220},
document_type={Article},
}