@ARTICLE{
author={Dankovic Danijel M,Zivanovic Emilija N,Veselinovic Nevena,Djordjevic Dunja,Petrovic Marija,Tasic Lana,Marjanovic Milos B,Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Ristic Goran S},
year={2025},
title={Examination of Impact of NBTIs on Commercial Power P-Channel VDMOS Transistors in Practical Applications},
journal={MICROMACHINES},
volume={17},
number={1},
pages={-},
document_type={Review},
} 

@ARTICLE{
author={Tasic Lana,Veselinovic Nevena,Petrovic Marija,Djordjevic Dunja,Marjanovic Milos B,Davidovic Vojkan S,Veljkovic Sandra,Mitrovic Nikola I,Zivanovic Emilija N,Dankovic Danijel M},
year={2025},
title={Experimental and SPICE-Based Modeling of NBTI and SHE in Power P-Channel VDMOS Transistors},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={267-272},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Veselinovic Nevena,Petrovic Marija,Djordjevic Dunja,Tasic Lana,Mitrovic Nikola I,Veljkovic Sandra,Marjanovic Milos B,Zivanovic Emilija N,Davidovic Vojkan S,Dankovic Danijel M},
year={2025},
title={Impact of NBTS and Thermal Relaxation on Characteristic of CMOS Inverter},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={83-87},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Djordjevic Dunja,Tasic Lana,Veselinovic Nevena,Petrovic Marija,Veljkovic Sandra,Mitrovic Nikola I,Marjanovic Milos B,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M},
year={2025},
title={Investigation of the Self-Heating Effect in a P-Channel VDMOS Transistor after NBT Stress and Relaxation},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={79-82},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Petrovic Marija,Veselinovic Nevena,Tasic Lana,Djordjevic Dunja,Veljkovic Sandra,Mitrovic Nikola I,Marjanovic Milos B,Zivanovic Emilija N,Dankovic Danijel M},
year={2025},
title={Investigation of NBTI and Relaxation Effects in P-Channel Power VDMOS Transistors},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={73-77},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Tasic Lana,Davidovic Vojkan S,Ristic Goran S,Prijic Zoran D},
year={2025},
title={Thermal Cycling and Irradiation Stressing of Low Impedance Aluminum Electrolytic Capacitors},
journal={2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL},
volume={},
number={},
pages={49-53},
document_type={Proceedings Paper},
} 

