Veljkovic Sandra,Mitrovic N,Davidovic Vojkan S,Paskaleva Albena,Spassov Dencho,Marjanovic M,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M (2026) Influence of controlling signal parameters and prior stresses on the self-heating of VDMOS power transistors, MICROELECTRONICS RELIABILITY, vol. 181, br. , str. - (Article) 

Dankovic Danijel M,Zivanovic Emilija N,Veselinovic Nevena,Djordjevic Dunja,Petrovic Marija,Tasic Lana,Marjanovic Milos B,Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Ristic Goran S (2025) Examination of Impact of NBTIs on Commercial Power P-Channel VDMOS Transistors in Practical Applications, MICROMACHINES, vol. 17, br. 1, str. - (Review) 

Djordjevic Dunja,Tasic Lana,Veselinovic Nevena,Petrovic Marija,Veljkovic Sandra,Mitrovic Nikola I,Marjanovic Milos B,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M (2025) Investigation of the Self-Heating Effect in a P-Channel VDMOS Transistor after NBT Stress and Relaxation, 2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL, vol. , br. , str. 79-82 (Proceedings Paper) 

Tasic Lana,Davidovic Vojkan S,Ristic Goran S,Prijic Zoran D (2025) Thermal Cycling and Irradiation Stressing of Low Impedance Aluminum Electrolytic Capacitors, 2025 IEEE 34TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, MIEL, vol. , br. , str. 49-53 (Proceedings Paper) 

Yilmaz Ercan,Ristic Goran S,Turan Rasit,Yilmaz Ozan,Gurer Umutcan,Lugonja Predrag,Budak Erhan,Marjanovic Milos B,Veljkovic Sandra,Mutale Alex,Kahraman Aysegul (2025) Proposal of dual-gate oxide layered with HfO2: Comparative results with SiO2-RadFET, RADIATION PHYSICS AND CHEMISTRY, vol. 232, br. , str. - (Article) 

Marjanovic Milos B,Ilic Stefan D,Veljkovic Sandra,Mitrovic Nikola I,Gurer Umutcan,Yilmaz Ozan,Kahraman Aysegul,Aktag Aliekber,Karacali Huseyin,Budak Erhan,Dankovic Danijel M,Ristic Goran S,Yilmaz Ercan (2025) The SPICE Modeling of a Radiation Sensor Based on a MOSFET with a Dielectric HfO<sub>2</sub>/SiO<sub>2</sub> Double-Layer, SENSORS, vol. 25, br. 2, str. - (Article) 

Djoric-Veljkovic Snezana M,Zivanovic Emilija N,Davidovic Vojkan S,Veljkovic Sandra,Mitrovic Nikola I,Ristic Goran S,Paskaleva Albena,Spassov Dencho,Dankovic Danijel M (2025) Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors, MICROMACHINES, vol. 16, br. 1, str. - (Article) 

Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M (2024) Successive Irradiation and Bias Temperature Stress Induced Effects on Commercial P-Channel Power Vdmos Transistors, FACTA UNIVERSITATIS-SERIES ELECTRONICS AND ENERGETICS, vol. 37, br. 4, str. 561-579 (Article) 

Mitrovic Nikola I,Guirado Damian,Dankovic Danijel M,Palma Alberto J,Ristic Goran S,Carvajal Miguel A (2024) Thermal Annealing-Induced Recovery of the VT of Irradiated Commercial MOS Transistors, JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, vol. , br. , str. - (Article; Early Access) 

Andjelkovic Marko Lj,...,Ilic Stefan D,Marjanovic Milos B,Veljkovic Sandra,Mitrovic Nikola I,Dankovic Danijel M,Ristic Goran S,...,(broj koautora 18) (2023) Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System, 2023 26TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN, DSD 2023, vol. , br. , str. 286-293 (Proceedings Paper) 

Kramberger G,Hiti Bojan,Cindro V,Howard A,Mandic Igor,Mikuz M,Petek M,Ristic Aleksa T,Ristic Goran S (2023) Gain dependence on free carrier concentration in LGADs, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 1046, br. , str. - (Article) 

Pousibet-Garrido A,Escobedo P,Guirado D,Ristic Goran S,Palma AJ,Carvajal MA (2023) Batteryless NFC dosimeter tag for ionizing radiation based on commercial MOSFET, SENSORS AND ACTUATORS A-PHYSICAL, vol. 354, br. , str. - (Article) 

Andjelkovic Marko,Marjanovic Milos B,Drasko Bojan,Calligaro Cristiano,Schrape Oliver,Gatti Umberto,Kuentzer Felipe A,Ilic Stefan D,Ristic Goran S,Krstic Milos D (2022) Analysis of Single Event Transient Effects in Standard Delay Cells Based on Decoupling Capacitors, JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, vol. 31, br. 18, str. - (Article) 

Andjelkovic Marko,Marjanovic Milos B,Chen Junchao,Ilic Stefan D,Ristic Goran S,Krstic Milos D (2022) PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients, MICROELECTRONICS RELIABILITY, vol. 138, br. , str. - (Article) 

Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Golubovic Snezana M,Djoric-Veljkovic Snezana M,Paskaleva Albena,Spassov Dencho,Stankovic Srboljub J,Andjelkovic Marko Lj,Prijic Zoran D,Manic Ivica Dj,Prijic Aneta P,Ristic Goran S,Dankovic Danijel M (2022) Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress, JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, vol. 31, br. 18, str. - (Article) 

Andjelkovic Marko,Simevski Aleksandar,Chen Junchao,Schrape Oliver,Stamenkovic Zoran,Krstic Milos D,Ilic Stefan D,Ristic Goran S,Jaksic Aleksandar B,Vasovic Nikola,Duane Russell,Palma Alberto J,Lallena Antonio M,Carvajal Miguel Angel (2022) A Design Concept for Radiation Hardened RADFET Readout System for Space Applications, MICROPROCESSORS AND MICROSYSTEMS, vol. 90, br. , str. - (Article) 

Ristic Goran S,Ilic Stefan D,Andjelkovic Marko S,Duane Russell,Palma Alberto J,Lalena Antonio M,Krstic Milos D,Jaksic Aleksandar B (2022) Sensitivity and fading of irradiated RADFETs with different gate voltages, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 1029, br. , str. - (Article) 

Ristic Goran S,Ilic Stefan D,Veljkovic Sandra,Jevtic Aleksandar S,Dimitrijevic Strahinja D,Palma Alberto J,Stankovic Srboljub J,Andjelkovic Marko S (2022) Commercial P-Channel Power VDMOSFET as X-ray Dosimeter, ELECTRONICS, vol. 11, br. 6, str. - (Article) 

Ristic Goran S,Andjelkovic Marko S,Duane Russell,Jaksic Aleksandar B (2022) Fading of pMOS dosimeters over a long period of time, MICRO & NANO LETTERS, vol. 17, br. 7, str. 155-158 (Letter) 

Ilic Stefan D,Andjelkovic Marko S,Duane Russell,Palma Alberto J,Sarajlic Milija J,Stankovic Srboljub J,Ristic Goran S (2021) Recharging process of commercial floating-gate MOS transistor in dosimetry application, MICROELECTRONICS RELIABILITY, vol. 126, br. , str. - (Article) 

Ristic Goran S,Ilic Stefan D,Duane Russell,Andjelkovic Marko S,Palma Alberto J,Lallena Antonio M,Krstic Milos D,Stankovic Srboljub J,Jaksic Aleksandar B (2021) Radiation sensitive MOSFETs irradiated with various positive gate biases, JOURNAL OF RADIATION RESEARCH AND APPLIED SCIENCES, vol. 14, br. 1, str. 353-357 (Article) 

Ristic Goran S,Andjelkovic Marko S,Duane Russell,Palma Alberto J,Jaksic Aleksandar B (2021) Radiation and Spontaneous Annealing of Radiation-sensitive Field-effect Transistors with Gate Oxide Thicknesses of 400 and 1000 nm, SENSORS AND MATERIALS, vol. 33, br. 6, str. 2109-2116 (Article) 

Andjelkovic Marko S,Simevski Aleksandar,Chen Junchao,Schrape Oliver,Stamenkovic Zoran,Krstic Milos D,Ilic Stefan D,Spahic Luka,Kostic Laza,Ristic Goran S,Jaksic Aleksandar B,Palma Alberto J,Lallena Antonio M,Carvajal Miguel Angel (2020) Design of Radiation Hardened RADFET Readout System for Space Applications, 2020 23RD EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN (DSD 2020), vol. , br. , str. 484-488 (Proceedings Paper) 

Ilic Stefan D,Jevtic Aleksandar S,Stankovic Srboljub J,Ristic Goran S (2020) Floating-Gate MOS Transistor with Dynamic Biasing as a Radiation Sensor, SENSORS, vol. 20, br. 11, str. - (Article) 

Maluckov Cedomir A,Radovic Miodrag K,Ristic Goran S (2017) Experimental investigations of commercial gas discharge tube "Osram St 111" using time lag measuring method, ELECTRICAL ENGINEERING, vol. 99, br. 1, str. 63-72 (Article) 

Andjelkovic Marko S,Ilic Aleksandar,Petrovic Vladimir,Nenadovic Miljana,Stamenkovic Zoran,Ristic Goran S (2016) SET Response of a SEL Protection Switch for 130 and 250 nm CMOS Technologies, 2016 IEEE 22ND INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS), vol. , br. , str. 185-190 (Proceedings Paper) 

Ristic Goran S,Andjelkovic Marko S,Savovic Svetislav M (2016) The isochronal annealing of irradiated n-channel power VDMOSFETs, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, vol. 366, br. , str. 171-178 (Article) 

Sokolovic Dusan T,Djordjevic Branka S,Kocic Gordana M,Jevtovic-Stoimenov Tatjana M,Stanojkovic Zoran A,Sokolovic Danka M,Veljkovic Andrej R,Ristic Goran S,Despotovic Milena R,Milisavljevic Dusan R,Jankovic Radmilo J,Binic Ivana I (2015) The Effects of Melatonin on Oxidative Stress Parameters and DNA Fragmentation in Testicular Tissue of Rats Exposed to Microwave Radiation, ADVANCES IN CLINICAL AND EXPERIMENTAL MEDICINE, vol. 24, br. 3, str. 429-436 (Article) 

Andjelkovic Marko S,Petrovic Vladimir,Stamenkovic Zoran,Ristic Goran S,Jovanovic Goran S (2015) Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection Switch, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, vol. 31, br. 3, str. 275-289 (Article) 

Ristic Goran S,Andjelkovic Marko S,Jaksic Aleksandar B (2015) The behavior of fixed and switching oxide traps of RADFETs during irradiation up to high absorbed doses, APPLIED RADIATION AND ISOTOPES, vol. 102, br. , str. 29-34 (Article) 

Andjelkovic Marko S,Ristic Goran S (2015) Current mode response of phototransistors to gamma radiation, RADIATION MEASUREMENTS, vol. 75, br. , str. 29-38 (Article) 

Andjelkovic Marko S,Ristic Goran S,Jaksic Aleksandar B (2015) Using RADFET for the real-time measurement of gamma radiation dose rate, MEASUREMENT SCIENCE & TECHNOLOGY, vol. 26, br. 2, str. - (Article) 

Stamenkovic Zoran,Vasovic Nikola D,Ristic Goran S (2014) Automatic and Reliable Electrical Characterization of MOSFETs, PROCEEDINGS OF THE 2014 IEEE 17TH INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS (DDECS), vol. , br. , str. 262-265 (Proceedings Paper) 

Maluckov Cedomir A,Radovic Miodrag K,Rancev Sasa A,Ristic Goran S,Karamarkovic Jugoslav P (2013) The Electrical Breakdown Time Delay Distributions in "Ge 155/500" Gas Diode (Starter), ROMANIAN REPORTS IN PHYSICS, vol. 65, br. 4, str. 1373-1383 (Article) 

Andjelkovic Marko S,Ristic Goran S (2013) Feasibility Study of a Current Mode Gamma Radiation Dosimeter Based on a Commercial Pin Photodiode and a Custom Made Auto-Ranging Electrometer, NUCLEAR TECHNOLOGY & RADIATION PROTECTION, vol. 28, br. 1, str. 73-83 (Article) 

Ristic Goran S,Vasovic Nikola D,Jaksic Aleksandar B (2012) The fixed oxide trap modelling during isothermal and isochronal annealing of irradiated RADFETs, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 45, br. 30, str. - (Article) 

Vasovic Nikola D,Ristic Goran S (2012) A switching system based on microcontroller for successive applying of MGT and CPT on MOSFETs, MEASUREMENT, vol. 45, br. 7, str. 1922-1926 (Article) 

Savovic Svetislav M,Djordjevich Alexandar,Ristic Goran S (2012) Numerical solution of the transport equation describing the radon transport from subsurface soil to buildings, RADIATION PROTECTION DOSIMETRY, vol. 150, br. 2, str. 213-216 (Article) 

Sokolovic Dusan T,Djordjevic Branka S,Kocic Gordana M,Babovic Petar,Ristic Goran S,Stanojkovic Zoran A,Sokolovic Dusan T,Veljkovic Andrej R,Jankovic Aleksandar S,Radovanovic Zoran L (2012) The effect of melatonin on body mass and behaviour of rats during an exposure to microwave radiation from mobile phone, BRATISLAVA MEDICAL JOURNAL-BRATISLAVSKE LEKARSKE LISTY, vol. 113, br. 5, str. 265-269 (Article) 

Vasovic Nikola D,Ristic Goran S (2012) A new microcontroller-based RADFET dosimeter reader, RADIATION MEASUREMENTS, vol. 47, br. 4, str. 272-276 (Article) 

Ristic Goran S (2012) Defect Behaviors During High Electric Field Stress of p-Channel Power MOSFETs, IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, vol. 12, br. 1, str. 94-100 (Article) 

Todorovic Miomir,Vasovic Nikola D,Ristic Goran S (2012) A system for gas electrical breakdown time delay measurements based on a microcontroller, MEASUREMENT SCIENCE & TECHNOLOGY, vol. 23, br. 1, str. - (Article) 

Ristic Goran S,Vasovic Nikola D,Kovacevic Milojko S,Jaksic Aleksandar B (2011) The sensitivity of 100 nm RADFETs with zero gate bias up to dose of 230 Gy(Si), NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, vol. 269, br. 23, str. 2703-2708 (Article) 

Ristic Goran S,Vasovic Nikola D (2011) Interface and oxide state behaviors of commercial n-channel power MOSFETs during high electric field stress and thermal annealing at 150 degrees C, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, vol. 26, br. 8, str. - (Article) 

Jelenkovic Emil V,Ristic Goran S,Pejovic Milic M,Jevtic Milan M,Jha Shrawan K,Videnovic-Misic Mirjana S,Pejovic Momcilo M,Tong KY (2011) Effect of fluorination and hydrogenation by ion implantation on reliability of poly-Si TFTs under gamma irradiation, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 44, br. 1, str. - (Article) 

Ristic Goran S (2009) Thermal and UV annealing of irradiated pMOS dosimetric transistors, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 42, br. 13, str. - (Article) 

Jha Shrawan K,Jelenkovic Emil V,Pejovic Milic M,Ristic Goran S,Pejovic Momcilo M,Tong KY,Surya C,Bello I,Zhang WJ (2009) Stability of submicron AlGaN/GaN HEMT devices irradiated by gamma rays, MICROELECTRONIC ENGINEERING, vol. 86, br. 1, str. 37-40 (Article) 

Nesic Nikola T,Ristic Goran S,Karamarkovic Jugoslav P,Pejovic Momcilo M (2008) Modelling of time delay of electrical breakdown for nitrogen-filled tubes at pressures of 6.6 and 13.3 mbar in the increase region of the memory curve, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 41, br. 22, str. - (Article) 

Ristic Goran S (2008) Influence of ionizing radiation and hot carrier injection on metal-oxide-semiconductor transistors, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 41, br. 2, str. - (Review) 

Pejovic Momcilo M,Karamarkovic Jugoslav P,Ristic Goran S,Pejovic Milic M (2008) Analysis of neutral active particle loss in afterglow in krypton at 2.6 mbar pressure, PHYSICS OF PLASMAS, vol. 15, br. 1, str. - (Article) 

Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B (2007) Physico-chemical processes in metal-oxide-semiconductor transistors with thick gate oxide during high electric field stress, JOURNAL OF NON-CRYSTALLINE SOLIDS, vol. 353, br. 2, str. 170-179 (Article) 

Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B (2006) Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing, APPLIED SURFACE SCIENCE, vol. 252, br. 8, str. 3023-3032 (Article) 

Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B (2005) Fowler-Nordheim high electric field stress of power VDMOSFETs, SOLID-STATE ELECTRONICS, vol. 49, br. 7, str. 1140-1152 (Article) 

Pejovic Milic M,Pejovic Momcilo M,Ristic Goran S (2005) Gamma and UV radiation effects on breakdown voltage of neon-filled tube, IEEE TRANSACTIONS ON PLASMA SCIENCE, vol. 33, br. 3, str. 1047-1052 (Article) 

Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B (2003) Comparison between post-irradiation annealing and post-high electric field stress annealing of n-channel power VDMOSFETs, APPLIED SURFACE SCIENCE, vol. 220, br. 1-4, str. 181-185 (Article) 

Pejovic Momcilo M,Ristic Goran S (2002) Memory effects in argon, nitrogen, and hydrogen, IEEE TRANSACTIONS ON PLASMA SCIENCE, vol. 30, br. 3, str. 1315-1319 (Article) 

Pejovic Momcilo M,Ristic Goran S,Milosavljevic Cedomir S,Pejovic Milic M (2002) Influence of tube wall material type and tube temperature on the recombination processes of nitrogen ions and atoms in afterglow, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 35, br. 20, str. 2536-2542 (Article) 

Jaksic Aleksandar B,Ristic Goran S,Pejovic Momcilo M,Mohammadzadeh A,Sudre C,Lane W (2002) Gamma-ray irradiation and post-irradiation responses of high dose range RADFETs, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 49, br. 3, str. 1356-1363 (Article) 

Pejovic Momcilo M,Ristic Goran S,Karamarkovic Jugoslav P (2002) Electrical breakdown in low pressure gases, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 35, br. 10, str. R91-R103 (Review) 

Pejovic Momcilo M,Ristic Goran S (2002) Analysis of mechanisms which lead to electrical breakdown in argon using the time delay method, PHYSICS OF PLASMAS, vol. 9, br. 1, str. 364-370 (Article) 

Jaksic Aleksandar B,Pejovic Momcilo M,Ristic Goran S (2000) Properties of latent interface-trap buildup in irradiated metal-oxide-semiconductor transistors determined by switched bias isothermal annealing experiments, APPLIED PHYSICS LETTERS, vol. 77, br. 25, str. 4220-4222 (Article) 

Pejovic Momcilo M,Ristic Goran S (2000) Analysis of mechanisms which lead to electrical breakdown in a krypton-filled tube using the time delay method, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 33, br. 21, str. 2786-2790 (Article) 

Jaksic Aleksandar B,Pejovic Momcilo M,Ristic Goran S (2000) Isothermal and isochronal annealing experiments on irradiated commercial power VDMOSFETs, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 47, br. 3, str. 659-666 (Article) 

Jaksic Aleksandar B,Ristic Goran S,Pejovic Momcilo M (2000) New experimental evidence of latent interface-trap buildup in power VDMOSFETs, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 47, br. 3, str. 580-586 (Article) 

Pejovic Momcilo M,Ristic Goran S (2000) Nitrogen-filled tube as a sensor of ionizing radiation, REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 71, br. 6, str. 2377-2379 (Article) 

Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B (2000) Analysis of postirradiation annealing of n-channel power vertical double-diffused metal-oxide-semiconductor transistors, JOURNAL OF APPLIED PHYSICS, vol. 87, br. 7, str. 3468-3477 (Article)