@ARTICLE{
author={Aleksic Sanja M,Pesic Biljana,Pantic Dragan S},
year={2013},
title={Simulation of semiconductor bulk trap influence on the electrical characteristics of the n-channel power VDMOS transistor},
journal={INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS},
volume={43},
number={2},
pages={124-130},
document_type={Article},
} 

@ARTICLE{
author={Prijic Aneta P,Prijic Zoran D,Pesic Biljana,Pantic Dragan S,Ristic Stojan,Mancic Dragan D,Petrusic Zoran M},
year={2008},
title={Design and Optimization of S-Type Thermal Cutoffs},
journal={IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES},
volume={31},
number={4},
pages={904-912},
document_type={Article},
} 

@ARTICLE{
author={Prijic Aneta P,Prijic Zoran D,Pesic Biljana},
year={2006},
title={A new method of evaluation of liquidus temperatures of ternary alloys},
journal={2006 25th International Conference on Microelectronics, Vols 1 and 2, Proceedings},
volume={},
number={},
pages={395-398},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Vracar Ljubomir M,Pesic Biljana,Stojadinovic Ninoslav D},
year={2005},
title={Computer as powerful tool in reliability testing of thin gate dielectrics in MOS devices},
journal={Eurocon 2005: The International Conference on Computer as a Tool, Vol 1 and 2 , Proceedings},
volume={},
number={},
pages={1159-1162},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Pesic Biljana,Vracar Ljubomir M,Stojadinovic Ninoslav D,Pecovska-Djordjevic M,Novkovski N},
year={2003},
title={Stress-induced leakage currents in thin silicon dioxide films},
journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS},
volume={14},
number={10-12},
pages={805-807},
document_type={Article},
}