Pejovic Momcilo M,Pejovic Milic M (2025) Processes in gases at low pressures induced by electrical breakdown and their influence on the memory effect, PHYSICS OF PLASMAS, vol. 32, br. 4, str. - (Review) 

Pejovic Milic M,Pejovic Momcilo M,Belic Cedomir I,Stankovic Koviljka Dj (2020) Separation of vacuum and gas breakdown processes in argon and their influence on electrical breakdown time delay, VACUUM, vol. 173, br. , str. - (Article) 

Pejovic Milic M,Pejovic Momcilo M,Stankovic Koviljka Dj (2018) Physico-Chemical Processes Induced by Electrical Breakdown and Discharge Responsible for Memory Effect in Krypton with < 10 ppm Nitrogen, PLASMA CHEMISTRY AND PLASMA PROCESSING, vol. 38, br. 2, str. 415-428 (Article) 

Pejovic Milic M,Stankovic Koviljka Dj,Fetahovic Irfan S,Pejovic Momcilo M (2017) Processes in insulating gas induced by electrical breakdown responsible for commercial gas-filled surge arresters delay response, VACUUM, vol. 137, br. , str. 85-91 (Article) 

Pejovic Svetlana M,Pejovic Momcilo M,Stojanov Dragan A (2016) Application of pMOS Dosimeters in Low-Field Mode for Radiation Dose Measurements Which Could Be Used in Radiotherapy, NUCLEAR TECHNOLOGY & RADIATION PROTECTION, vol. 31, br. 4, str. 349-355 (Article) 

Pejovic Milic M,Nesic Nikola T,Pejovic Momcilo M (2014) Kinetics of positive ions and electrically neutral active particles in afterglow in neon at low pressure, PHYSICS OF PLASMAS, vol. 21, br. 4, str. - (Article) 

Pejovic Milic M,Nesic Nikola T,Pejovic Momcilo M (2014) Electrical Breakdown Time Delay in Nitrogen Filled Tube with Small Inter Electrode Gap, IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, vol. 21, br. 2, str. 612-616 (Article) 

Vasic Aleksandra I,Osmokrovic Predrag V,Marjanovic Nenad,Pejovic Momcilo M (2013) Radiation Effects in Solar Cells and Optoelectronic Devices, INTERNATIONAL JOURNAL OF PHOTOENERGY, vol. , br. , str. - (Editorial Material) 

Pejovic Momcilo M,Spasic Ivana V,Pejovic Milic M,Nesic Nikola T,Brajovic Dragan V (2013) Processes in afterglow responsible for initiation of electrical breakdown in xenon at low pressure, JOURNAL OF PLASMA PHYSICS, vol. 79, br. , str. 641-646 (Article) 

Pejovic Milic M,Pejovic Momcilo M,Jaksic Aleksandar B (2013) Response of pMOS dosemeters on gamma-ray irradiation during its re-use, RADIATION PROTECTION DOSIMETRY, vol. 155, br. 4, str. 394-403 (Article) 

Pejovic Svetlana M,Bosnjakovic Petar M,Ciraj-Bjelac Olivera F,Pejovic Momcilo M (2013) Characteristics of a pMOSFET suitable for use in radiotherapy, APPLIED RADIATION AND ISOTOPES, vol. 77, br. , str. 44-49 (Article) 

Pejovic Milic M,Pejovic Momcilo M,Maric Radeta,Timotijevic Ljubinko,Stankovic Koviljka Dj (2012) Delay Response of Gas Discharge Tubes, PROCEEDINGS OF PROGRESS IN ELECTROMAGNETICS RESEARCH SYMPOSIUM (PIERS 2012), vol. , br. , str. 1156-1159 (Proceedings Paper) 

Pejovic Milic M,Pejovic Momcilo M,Jaksic Aleksandar B,Stankovic Koviljka Dj,Markovic Slavoljub A (2012) Successive Gamma-Ray Irradiation and Corresponding Post-Irradiation Annealing of Pmos Dosimeters, NUCLEAR TECHNOLOGY & RADIATION PROTECTION, vol. 27, br. 4, str. 341-345 (Article) 

Pejovic Momcilo M,Nesic Nikola T,Pejovic Milic M,Brajovic Dragan V,Denic Ivana V (2012) Investigation of post-discharge processes in nitrogen at low pressure, PHYSICS OF PLASMAS, vol. 19, br. 12, str. - (Article) 

Pejovic Momcilo M,Zivanovic Emilija N,Pejovic Milic M,Nesic Nikola T,Kovacevic Dragan (2012) Investigation of breakdown voltage and electrical breakdown time delay in air-filled tube in presence of combined gas and vacuum breakdown mechanism, VACUUM, vol. 86, br. 12, str. 1860-1866 (Article) 

Pejovic Momcilo M,Nesic Nikola T,Pejovic Milic M,Zivanovic Emilija N (2012) Afterglow processes responsible for memory effect in nitrogen, JOURNAL OF APPLIED PHYSICS, vol. 112, br. 1, str. - (Article) 

Pejovic Milic M,Pejovic Momcilo M,Jaksic Aleksandar B (2012) Contribution of fixed oxide traps to sensitivity of pMOS dosimeters during gamma ray irradiation and annealing at room and elevated temperature, SENSORS AND ACTUATORS A-PHYSICAL, vol. 174, br. , str. 85-90 (Article) 

Pejovic Momcilo M,Pejovic Svetlana M,Dolicanin Edin C,Lazarevic Djordje R (2011) Gamma-Ray Irradiation and Post-Irradiation at Room and Elevated Temperature Response of Pmos Dosimeters with Thick Gate Oxides, NUCLEAR TECHNOLOGY & RADIATION PROTECTION, vol. 26, br. 3, str. 261-265 (Article) 

Zivanovic Emilija N,Pejovic Momcilo M,Pejovic Milic M,Nesic Nikola T (2011) Analysis of Statistical Nature of Electrical Breakdown Time Delay in Nitrogen at 6.6 mbar Pressure in Presence of Positive Ions and N((4)S) Atoms, CONTRIBUTIONS TO PLASMA PHYSICS, vol. 51, br. 9, str. 877-884 (Article) 

Pejovic Milic M,Pejovic Momcilo M,Stankovic Koviljka Dj (2011) Experimental Investigation of Breakdown Voltage and Electrical Breakdown Time Delay of Commercial Gas Discharge Tubes, JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 50, br. 8, str. - (Article) 

Pejovic Milic M,Pejovic Momcilo M,Jaksic Aleksandar B (2011) Radiation-sensitive Field Effect Transistor Response to Gamma-ray Irradiation, NUCLEAR TECHNOLOGY & RADIATION PROTECTION, vol. 26, br. 1, str. 25-31 (Article) 

Nesic Nikola T,Pejovic Momcilo M,Pejovic Milic M,Zivanovic Emilija N (2011) The influence of additional electrons on memory effect in nitrogen at low pressures, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 44, br. 9, str. - (Article) 

Jelenkovic Emil V,Ristic Goran S,Pejovic Milic M,Jevtic Milan M,Jha Shrawan K,Videnovic-Misic Mirjana S,Pejovic Momcilo M,Tong KY (2011) Effect of fluorination and hydrogenation by ion implantation on reliability of poly-Si TFTs under gamma irradiation, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 44, br. 1, str. - (Article) 

Pejovic Milic M,Denic Dragan B,Pejovic Momcilo M,Nesic Nikola T,Vasovic Nikola D (2010) Microcontroller based system for electrical breakdown time delay measurement in gas-filled devices, REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 81, br. 10, str. - (Article) 

Pejovic Momcilo M,Zivanovic Emilija N,Pejovic Milic M,Karamarkovic Jugoslav P (2010) Analysis of processes responsible for the memory effect in air at low pressures, PLASMA SOURCES SCIENCE & TECHNOLOGY, vol. 19, br. 4, str. - (Article) 

Jha Shrawan K,Jelenkovic Emil V,Pejovic Milic M,Ristic Goran S,Pejovic Momcilo M,Tong KY,Surya C,Bello I,Zhang WJ (2009) Stability of submicron AlGaN/GaN HEMT devices irradiated by gamma rays, MICROELECTRONIC ENGINEERING, vol. 86, br. 1, str. 37-40 (Article) 

Zivanovic Emilija N,Pejovic Momcilo M (2008) Memory Effect In Air In The Presence Of Vacuum Breakdown Mechanism, 24TH SUMMER SCHOOL AND INTERNATIONAL SYMPOSIUM ON THE PHYSICS OF IONIZED GASES, CONTRIBUTED PAPERS, vol. , br. 84, str. 293-296 (Proceedings Paper) 

Nesic Nikola T,Ristic Goran S,Karamarkovic Jugoslav P,Pejovic Momcilo M (2008) Modelling of time delay of electrical breakdown for nitrogen-filled tubes at pressures of 6.6 and 13.3 mbar in the increase region of the memory curve, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 41, br. 22, str. - (Article) 

Pejovic Momcilo M,Pejovic Milic M (2008) Contribution of statistical time delay and formative time to total electrical breakdown time delay in argon for different afterglow periods, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, vol. 26, br. 5, str. 1326-1330 (Article) 

Aleksic Sanja M,Jaksic Aleksandar B,Pejovic Momcilo M (2008) Repeating of positive and negative high electric field stress and corresponding thermal post-stress annealing of the n-channel power VDMOSFETs, SOLID-STATE ELECTRONICS, vol. 52, br. 8, str. 1197-1201 (Article) 

Pejovic Momcilo M,Karamarkovic Jugoslav P,Ristic Goran S,Pejovic Milic M (2008) Analysis of neutral active particle loss in afterglow in krypton at 2.6 mbar pressure, PHYSICS OF PLASMAS, vol. 15, br. 1, str. - (Article) 

Pejovic Momcilo M,Pejovic Milic M (2008) Memory effect in argon in the presence of vacuum and gas electrical breakdown mechanisms, APPLIED PHYSICS LETTERS, vol. 92, br. 1, str. - (Article) 

Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B (2007) Physico-chemical processes in metal-oxide-semiconductor transistors with thick gate oxide during high electric field stress, JOURNAL OF NON-CRYSTALLINE SOLIDS, vol. 353, br. 2, str. 170-179 (Article) 

Pejovic Milic M,Pejovic Momcilo M (2006) Investigations of breakdown voltage and time delay of gas-filled surge arresters, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 39, br. 20, str. 4417-4422 (Article) 

Maluckov Cedomir A,Karamarkovic Jugoslav P,Radovic Miodrag K,Pejovic Momcilo M (2006) Statistical analysis of the electrical breakdown time delay distributions in krypton, PHYSICS OF PLASMAS, vol. 13, br. 8, str. - (Article) 

Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B (2006) Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing, APPLIED SURFACE SCIENCE, vol. 252, br. 8, str. 3023-3032 (Article) 

Pejovic Momcilo M,Nesic Nikola T,Pejovic Milic M (2006) Analysis of low-pressure dc breakdown in nitrogen between two spherical iron electrodes, PHYSICS OF PLASMAS, vol. 13, br. 2, str. - (Article) 

Maluckov Cedomir A,Karamarkovic Jugoslav P,Radovic Miodrag K,Pejovic Momcilo M (2006) The application of convolution-based statistical model on the electrical breakdown time delay distributions in neon under gamma and UV radiation, IEEE TRANSACTIONS ON PLASMA SCIENCE, vol. 34, br. 1, str. 2-6 (Article) 

Pejovic Momcilo M,Pejovic Milic M (2005) The influence of some species formed during the discharge and gamma and UV radiation on breakdown voltage and time delay in nitrogen and neon at low pressure, PLASMA SOURCES SCIENCE & TECHNOLOGY, vol. 14, br. 3, str. 492-500 (Article) 

Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B (2005) Fowler-Nordheim high electric field stress of power VDMOSFETs, SOLID-STATE ELECTRONICS, vol. 49, br. 7, str. 1140-1152 (Article) 

Pejovic Milic M,Pejovic Momcilo M,Ristic Goran S (2005) Gamma and UV radiation effects on breakdown voltage of neon-filled tube, IEEE TRANSACTIONS ON PLASMA SCIENCE, vol. 33, br. 3, str. 1047-1052 (Article) 

Maluckov Cedomir A,Karamarkovic Jugoslav P,Radovic Miodrag K,Pejovic Momcilo M (2004) The application of convolution-based statistical model on the electrical breakdown time delay distributions in neon, PHYSICS OF PLASMAS, vol. 11, br. 11, str. 5328-5334 (Article) 

Pejovic Momcilo M (2004) Analysis of the memory effect in a nitrogen-filled tube at 6.6 mbar pressure for different cathode materials using the time delay method, PHYSICS OF PLASMAS, vol. 11, br. 8, str. 3778-3786 (Article) 

Pejovic Momcilo M,Zivanovic Emilija N,Pejovic Milic M (2004) Kinetics of ions and neutral active states in the afterglow and their influence on the memory effect in nitrogen at low pressures, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 37, br. 2, str. 200-210 (Article) 

Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B (2003) Comparison between post-irradiation annealing and post-high electric field stress annealing of n-channel power VDMOSFETs, APPLIED SURFACE SCIENCE, vol. 220, br. 1-4, str. 181-185 (Article) 

Spasic IV,Radovic Miodrag K,Pejovic Momcilo M,Maluckov Cedomir A (2003) The statistical time-delay and the breakdown formative time contributions to the memory effect in Ne at 7 mbar pressure, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 36, br. 20, str. 2515-2520 (Article) 

Pejovic Momcilo M,Milosavljevic Cedomir S,Pejovic Milic M (2003) The estimation of static breakdown voltage for gas-filled tubes at low pressures using dynamic method, IEEE TRANSACTIONS ON PLASMA SCIENCE, vol. 31, br. 4, str. 776-781 (Article) 

Pejovic Milic M,Milosavljevic Cedomir S,Pejovic Momcilo M (2003) Electrical system for measurement of breakdown voltage of vacuum and gas-filled tubes using a dynamic method, REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 74, br. 6, str. 3127-3129 (Article) 

Pejovic Momcilo M,Ristic Goran S (2002) Memory effects in argon, nitrogen, and hydrogen, IEEE TRANSACTIONS ON PLASMA SCIENCE, vol. 30, br. 3, str. 1315-1319 (Article) 

Pejovic Momcilo M,Ristic Goran S,Milosavljevic Cedomir S,Pejovic Milic M (2002) Influence of tube wall material type and tube temperature on the recombination processes of nitrogen ions and atoms in afterglow, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 35, br. 20, str. 2536-2542 (Article) 

Jaksic Aleksandar B,Ristic Goran S,Pejovic Momcilo M,Mohammadzadeh A,Sudre C,Lane W (2002) Gamma-ray irradiation and post-irradiation responses of high dose range RADFETs, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 49, br. 3, str. 1356-1363 (Article) 

Pejovic Momcilo M,Ristic Goran S,Karamarkovic Jugoslav P (2002) Electrical breakdown in low pressure gases, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 35, br. 10, str. R91-R103 (Review) 

Pejovic Momcilo M,Ristic Goran S (2002) Analysis of mechanisms which lead to electrical breakdown in argon using the time delay method, PHYSICS OF PLASMAS, vol. 9, br. 1, str. 364-370 (Article) 

Petrovic Zoran Lj,Markovic Vidosav Lj,Pejovic Momcilo M,Gocic Sasa R (2001) Memory effects in the afterglow: open questions on long-lived species and the role of surface processes, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 34, br. 12, str. 1756-1768 (Article) 

Jaksic Aleksandar B,Pejovic Momcilo M,Ristic Goran S (2000) Properties of latent interface-trap buildup in irradiated metal-oxide-semiconductor transistors determined by switched bias isothermal annealing experiments, APPLIED PHYSICS LETTERS, vol. 77, br. 25, str. 4220-4222 (Article) 

Pejovic Momcilo M,Ristic Goran S (2000) Analysis of mechanisms which lead to electrical breakdown in a krypton-filled tube using the time delay method, JOURNAL OF PHYSICS D-APPLIED PHYSICS, vol. 33, br. 21, str. 2786-2790 (Article) 

Jaksic Aleksandar B,Pejovic Momcilo M,Ristic Goran S (2000) Isothermal and isochronal annealing experiments on irradiated commercial power VDMOSFETs, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 47, br. 3, str. 659-666 (Article) 

Jaksic Aleksandar B,Ristic Goran S,Pejovic Momcilo M (2000) New experimental evidence of latent interface-trap buildup in power VDMOSFETs, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 47, br. 3, str. 580-586 (Article) 

Pejovic Momcilo M,Ristic Goran S (2000) Nitrogen-filled tube as a sensor of ionizing radiation, REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 71, br. 6, str. 2377-2379 (Article) 

Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B (2000) Analysis of postirradiation annealing of n-channel power vertical double-diffused metal-oxide-semiconductor transistors, JOURNAL OF APPLIED PHYSICS, vol. 87, br. 7, str. 3468-3477 (Article)