@ARTICLE{
author={Pejovic Momcilo M,Pejovic Milic M},
year={2025},
title={Processes in gases at low pressures induced by electrical breakdown and their influence on the memory effect},
journal={PHYSICS OF PLASMAS},
volume={32},
number={4},
pages={-},
document_type={Review},
} 

@ARTICLE{
author={Pejovic Milic M,Pejovic Momcilo M,Belic Cedomir I,Stankovic Koviljka Dj},
year={2020},
title={Separation of vacuum and gas breakdown processes in argon and their influence on electrical breakdown time delay},
journal={VACUUM},
volume={173},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Pejovic Momcilo M,Stankovic Koviljka Dj},
year={2018},
title={Physico-Chemical Processes Induced by Electrical Breakdown and Discharge Responsible for Memory Effect in Krypton with < 10 ppm Nitrogen},
journal={PLASMA CHEMISTRY AND PLASMA PROCESSING},
volume={38},
number={2},
pages={415-428},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Stankovic Koviljka Dj,Fetahovic Irfan S,Pejovic Momcilo M},
year={2017},
title={Processes in insulating gas induced by electrical breakdown responsible for commercial gas-filled surge arresters delay response},
journal={VACUUM},
volume={137},
number={},
pages={85-91},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Svetlana M,Pejovic Momcilo M,Stojanov Dragan A},
year={2016},
title={Application of pMOS Dosimeters in Low-Field Mode for Radiation Dose Measurements Which Could Be Used in Radiotherapy},
journal={NUCLEAR TECHNOLOGY & RADIATION PROTECTION},
volume={31},
number={4},
pages={349-355},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Nesic Nikola T,Pejovic Momcilo M},
year={2014},
title={Kinetics of positive ions and electrically neutral active particles in afterglow in neon at low pressure},
journal={PHYSICS OF PLASMAS},
volume={21},
number={4},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Nesic Nikola T,Pejovic Momcilo M},
year={2014},
title={Electrical Breakdown Time Delay in Nitrogen Filled Tube with Small Inter Electrode Gap},
journal={IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION},
volume={21},
number={2},
pages={612-616},
document_type={Article},
} 

@ARTICLE{
author={Vasic Aleksandra I,Osmokrovic Predrag V,Marjanovic Nenad,Pejovic Momcilo M},
year={2013},
title={Radiation Effects in Solar Cells and Optoelectronic Devices},
journal={INTERNATIONAL JOURNAL OF PHOTOENERGY},
volume={},
number={},
pages={-},
document_type={Editorial Material},
} 

@ARTICLE{
author={Pejovic Momcilo M,Spasic Ivana V,Pejovic Milic M,Nesic Nikola T,Brajovic Dragan V},
year={2013},
title={Processes in afterglow responsible for initiation of electrical breakdown in xenon at low pressure},
journal={JOURNAL OF PLASMA PHYSICS},
volume={79},
number={},
pages={641-646},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Pejovic Momcilo M,Jaksic Aleksandar B},
year={2013},
title={Response of pMOS dosemeters on gamma-ray irradiation during its re-use},
journal={RADIATION PROTECTION DOSIMETRY},
volume={155},
number={4},
pages={394-403},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Svetlana M,Bosnjakovic Petar M,Ciraj-Bjelac Olivera F,Pejovic Momcilo M},
year={2013},
title={Characteristics of a pMOSFET suitable for use in radiotherapy},
journal={APPLIED RADIATION AND ISOTOPES},
volume={77},
number={},
pages={44-49},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Pejovic Momcilo M,Maric Radeta,Timotijevic Ljubinko,Stankovic Koviljka Dj},
year={2012},
title={Delay Response of Gas Discharge Tubes},
journal={PROCEEDINGS OF PROGRESS IN ELECTROMAGNETICS RESEARCH SYMPOSIUM (PIERS 2012)},
volume={},
number={},
pages={1156-1159},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Pejovic Milic M,Pejovic Momcilo M,Jaksic Aleksandar B,Stankovic Koviljka Dj,Markovic Slavoljub A},
year={2012},
title={Successive Gamma-Ray Irradiation and Corresponding Post-Irradiation Annealing of Pmos Dosimeters},
journal={NUCLEAR TECHNOLOGY & RADIATION PROTECTION},
volume={27},
number={4},
pages={341-345},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Nesic Nikola T,Pejovic Milic M,Brajovic Dragan V,Denic Ivana V},
year={2012},
title={Investigation of post-discharge processes in nitrogen at low pressure},
journal={PHYSICS OF PLASMAS},
volume={19},
number={12},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Zivanovic Emilija N,Pejovic Milic M,Nesic Nikola T,Kovacevic Dragan},
year={2012},
title={Investigation of breakdown voltage and electrical breakdown time delay in air-filled tube in presence of combined gas and vacuum breakdown mechanism},
journal={VACUUM},
volume={86},
number={12},
pages={1860-1866},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Nesic Nikola T,Pejovic Milic M,Zivanovic Emilija N},
year={2012},
title={Afterglow processes responsible for memory effect in nitrogen},
journal={JOURNAL OF APPLIED PHYSICS},
volume={112},
number={1},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Pejovic Momcilo M,Jaksic Aleksandar B},
year={2012},
title={Contribution of fixed oxide traps to sensitivity of pMOS dosimeters during gamma ray irradiation and annealing at room and elevated temperature},
journal={SENSORS AND ACTUATORS A-PHYSICAL},
volume={174},
number={},
pages={85-90},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Pejovic Svetlana M,Dolicanin Edin C,Lazarevic Djordje R},
year={2011},
title={Gamma-Ray Irradiation and Post-Irradiation at Room and Elevated Temperature Response of Pmos Dosimeters with Thick Gate Oxides},
journal={NUCLEAR TECHNOLOGY & RADIATION PROTECTION},
volume={26},
number={3},
pages={261-265},
document_type={Article},
} 

@ARTICLE{
author={Zivanovic Emilija N,Pejovic Momcilo M,Pejovic Milic M,Nesic Nikola T},
year={2011},
title={Analysis of Statistical Nature of Electrical Breakdown Time Delay in Nitrogen at 6.6 mbar Pressure in Presence of Positive Ions and N((4)S) Atoms},
journal={CONTRIBUTIONS TO PLASMA PHYSICS},
volume={51},
number={9},
pages={877-884},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Pejovic Momcilo M,Stankovic Koviljka Dj},
year={2011},
title={Experimental Investigation of Breakdown Voltage and Electrical Breakdown Time Delay of Commercial Gas Discharge Tubes},
journal={JAPANESE JOURNAL OF APPLIED PHYSICS},
volume={50},
number={8},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Pejovic Momcilo M,Jaksic Aleksandar B},
year={2011},
title={Radiation-sensitive Field Effect Transistor Response to Gamma-ray Irradiation},
journal={NUCLEAR TECHNOLOGY & RADIATION PROTECTION},
volume={26},
number={1},
pages={25-31},
document_type={Article},
} 

@ARTICLE{
author={Nesic Nikola T,Pejovic Momcilo M,Pejovic Milic M,Zivanovic Emilija N},
year={2011},
title={The influence of additional electrons on memory effect in nitrogen at low pressures},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={44},
number={9},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Jelenkovic Emil V,Ristic Goran S,Pejovic Milic M,Jevtic Milan M,Jha Shrawan K,Videnovic-Misic Mirjana S,Pejovic Momcilo M,Tong KY},
year={2011},
title={Effect of fluorination and hydrogenation by ion implantation on reliability of poly-Si TFTs under gamma irradiation},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={44},
number={1},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Denic Dragan B,Pejovic Momcilo M,Nesic Nikola T,Vasovic Nikola D},
year={2010},
title={Microcontroller based system for electrical breakdown time delay measurement in gas-filled devices},
journal={REVIEW OF SCIENTIFIC INSTRUMENTS},
volume={81},
number={10},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Zivanovic Emilija N,Pejovic Milic M,Karamarkovic Jugoslav P},
year={2010},
title={Analysis of processes responsible for the memory effect in air at low pressures},
journal={PLASMA SOURCES SCIENCE & TECHNOLOGY},
volume={19},
number={4},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Jha Shrawan K,Jelenkovic Emil V,Pejovic Milic M,Ristic Goran S,Pejovic Momcilo M,Tong KY,Surya C,Bello I,Zhang WJ},
year={2009},
title={Stability of submicron AlGaN/GaN HEMT devices irradiated by gamma rays},
journal={MICROELECTRONIC ENGINEERING},
volume={86},
number={1},
pages={37-40},
document_type={Article},
} 

@ARTICLE{
author={Zivanovic Emilija N,Pejovic Momcilo M},
year={2008},
title={Memory Effect In Air In The Presence Of Vacuum Breakdown Mechanism},
journal={24TH SUMMER SCHOOL AND INTERNATIONAL SYMPOSIUM ON THE PHYSICS OF IONIZED GASES, CONTRIBUTED PAPERS},
volume={},
number={84},
pages={293-296},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Nesic Nikola T,Ristic Goran S,Karamarkovic Jugoslav P,Pejovic Momcilo M},
year={2008},
title={Modelling of time delay of electrical breakdown for nitrogen-filled tubes at pressures of 6.6 and 13.3 mbar in the increase region of the memory curve},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={41},
number={22},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Pejovic Milic M},
year={2008},
title={Contribution of statistical time delay and formative time to total electrical breakdown time delay in argon for different afterglow periods},
journal={JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A},
volume={26},
number={5},
pages={1326-1330},
document_type={Article},
} 

@ARTICLE{
author={Aleksic Sanja M,Jaksic Aleksandar B,Pejovic Momcilo M},
year={2008},
title={Repeating of positive and negative high electric field stress and corresponding thermal post-stress annealing of the n-channel power VDMOSFETs},
journal={SOLID-STATE ELECTRONICS},
volume={52},
number={8},
pages={1197-1201},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Karamarkovic Jugoslav P,Ristic Goran S,Pejovic Milic M},
year={2008},
title={Analysis of neutral active particle loss in afterglow in krypton at 2.6 mbar pressure},
journal={PHYSICS OF PLASMAS},
volume={15},
number={1},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Pejovic Milic M},
year={2008},
title={Memory effect in argon in the presence of vacuum and gas electrical breakdown mechanisms},
journal={APPLIED PHYSICS LETTERS},
volume={92},
number={1},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B},
year={2007},
title={Physico-chemical processes in metal-oxide-semiconductor transistors with thick gate oxide during high electric field stress},
journal={JOURNAL OF NON-CRYSTALLINE SOLIDS},
volume={353},
number={2},
pages={170-179},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Pejovic Momcilo M},
year={2006},
title={Investigations of breakdown voltage and time delay of gas-filled surge arresters},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={39},
number={20},
pages={4417-4422},
document_type={Article},
} 

@ARTICLE{
author={Maluckov Cedomir A,Karamarkovic Jugoslav P,Radovic Miodrag K,Pejovic Momcilo M},
year={2006},
title={Statistical analysis of the electrical breakdown time delay distributions in krypton},
journal={PHYSICS OF PLASMAS},
volume={13},
number={8},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B},
year={2006},
title={Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing},
journal={APPLIED SURFACE SCIENCE},
volume={252},
number={8},
pages={3023-3032},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Nesic Nikola T,Pejovic Milic M},
year={2006},
title={Analysis of low-pressure dc breakdown in nitrogen between two spherical iron electrodes},
journal={PHYSICS OF PLASMAS},
volume={13},
number={2},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Maluckov Cedomir A,Karamarkovic Jugoslav P,Radovic Miodrag K,Pejovic Momcilo M},
year={2006},
title={The application of convolution-based statistical model on the electrical breakdown time delay distributions in neon under gamma and UV radiation},
journal={IEEE TRANSACTIONS ON PLASMA SCIENCE},
volume={34},
number={1},
pages={2-6},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Pejovic Milic M},
year={2005},
title={The influence of some species formed during the discharge and gamma and UV radiation on breakdown voltage and time delay in nitrogen and neon at low pressure},
journal={PLASMA SOURCES SCIENCE & TECHNOLOGY},
volume={14},
number={3},
pages={492-500},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B},
year={2005},
title={Fowler-Nordheim high electric field stress of power VDMOSFETs},
journal={SOLID-STATE ELECTRONICS},
volume={49},
number={7},
pages={1140-1152},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Pejovic Momcilo M,Ristic Goran S},
year={2005},
title={Gamma and UV radiation effects on breakdown voltage of neon-filled tube},
journal={IEEE TRANSACTIONS ON PLASMA SCIENCE},
volume={33},
number={3},
pages={1047-1052},
document_type={Article},
} 

@ARTICLE{
author={Maluckov Cedomir A,Karamarkovic Jugoslav P,Radovic Miodrag K,Pejovic Momcilo M},
year={2004},
title={The application of convolution-based statistical model on the electrical breakdown time delay distributions in neon},
journal={PHYSICS OF PLASMAS},
volume={11},
number={11},
pages={5328-5334},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M},
year={2004},
title={Analysis of the memory effect in a nitrogen-filled tube at 6.6 mbar pressure for different cathode materials using the time delay method},
journal={PHYSICS OF PLASMAS},
volume={11},
number={8},
pages={3778-3786},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Zivanovic Emilija N,Pejovic Milic M},
year={2004},
title={Kinetics of ions and neutral active states in the afterglow and their influence on the memory effect in nitrogen at low pressures},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={37},
number={2},
pages={200-210},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B},
year={2003},
title={Comparison between post-irradiation annealing and post-high electric field stress annealing of n-channel power VDMOSFETs},
journal={APPLIED SURFACE SCIENCE},
volume={220},
number={1-4},
pages={181-185},
document_type={Article},
} 

@ARTICLE{
author={Spasic IV,Radovic Miodrag K,Pejovic Momcilo M,Maluckov Cedomir A},
year={2003},
title={The statistical time-delay and the breakdown formative time contributions to the memory effect in Ne at 7 mbar pressure},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={36},
number={20},
pages={2515-2520},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Milosavljevic Cedomir S,Pejovic Milic M},
year={2003},
title={The estimation of static breakdown voltage for gas-filled tubes at low pressures using dynamic method},
journal={IEEE TRANSACTIONS ON PLASMA SCIENCE},
volume={31},
number={4},
pages={776-781},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Milic M,Milosavljevic Cedomir S,Pejovic Momcilo M},
year={2003},
title={Electrical system for measurement of breakdown voltage of vacuum and gas-filled tubes using a dynamic method},
journal={REVIEW OF SCIENTIFIC INSTRUMENTS},
volume={74},
number={6},
pages={3127-3129},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Ristic Goran S},
year={2002},
title={Memory effects in argon, nitrogen, and hydrogen},
journal={IEEE TRANSACTIONS ON PLASMA SCIENCE},
volume={30},
number={3},
pages={1315-1319},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Ristic Goran S,Milosavljevic Cedomir S,Pejovic Milic M},
year={2002},
title={Influence of tube wall material type and tube temperature on the recombination processes of nitrogen ions and atoms in afterglow},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={35},
number={20},
pages={2536-2542},
document_type={Article},
} 

@ARTICLE{
author={Jaksic Aleksandar B,Ristic Goran S,Pejovic Momcilo M,Mohammadzadeh A,Sudre C,Lane W},
year={2002},
title={Gamma-ray irradiation and post-irradiation responses of high dose range RADFETs},
journal={IEEE TRANSACTIONS ON NUCLEAR SCIENCE},
volume={49},
number={3},
pages={1356-1363},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Ristic Goran S,Karamarkovic Jugoslav P},
year={2002},
title={Electrical breakdown in low pressure gases},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={35},
number={10},
pages={R91-R103},
document_type={Review},
} 

@ARTICLE{
author={Pejovic Momcilo M,Ristic Goran S},
year={2002},
title={Analysis of mechanisms which lead to electrical breakdown in argon using the time delay method},
journal={PHYSICS OF PLASMAS},
volume={9},
number={1},
pages={364-370},
document_type={Article},
} 

@ARTICLE{
author={Petrovic Zoran Lj,Markovic Vidosav Lj,Pejovic Momcilo M,Gocic Sasa R},
year={2001},
title={Memory effects in the afterglow: open questions on long-lived species and the role of surface processes},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={34},
number={12},
pages={1756-1768},
document_type={Article},
} 

@ARTICLE{
author={Jaksic Aleksandar B,Pejovic Momcilo M,Ristic Goran S},
year={2000},
title={Properties of latent interface-trap buildup in irradiated metal-oxide-semiconductor transistors determined by switched bias isothermal annealing experiments},
journal={APPLIED PHYSICS LETTERS},
volume={77},
number={25},
pages={4220-4222},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Ristic Goran S},
year={2000},
title={Analysis of mechanisms which lead to electrical breakdown in a krypton-filled tube using the time delay method},
journal={JOURNAL OF PHYSICS D-APPLIED PHYSICS},
volume={33},
number={21},
pages={2786-2790},
document_type={Article},
} 

@ARTICLE{
author={Jaksic Aleksandar B,Pejovic Momcilo M,Ristic Goran S},
year={2000},
title={Isothermal and isochronal annealing experiments on irradiated commercial power VDMOSFETs},
journal={IEEE TRANSACTIONS ON NUCLEAR SCIENCE},
volume={47},
number={3},
pages={659-666},
document_type={Article},
} 

@ARTICLE{
author={Jaksic Aleksandar B,Ristic Goran S,Pejovic Momcilo M},
year={2000},
title={New experimental evidence of latent interface-trap buildup in power VDMOSFETs},
journal={IEEE TRANSACTIONS ON NUCLEAR SCIENCE},
volume={47},
number={3},
pages={580-586},
document_type={Article},
} 

@ARTICLE{
author={Pejovic Momcilo M,Ristic Goran S},
year={2000},
title={Nitrogen-filled tube as a sensor of ionizing radiation},
journal={REVIEW OF SCIENTIFIC INSTRUMENTS},
volume={71},
number={6},
pages={2377-2379},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S,Pejovic Momcilo M,Jaksic Aleksandar B},
year={2000},
title={Analysis of postirradiation annealing of n-channel power vertical double-diffused metal-oxide-semiconductor transistors},
journal={JOURNAL OF APPLIED PHYSICS},
volume={87},
number={7},
pages={3468-3477},
document_type={Article},
}