@ARTICLE{
author={Pesic Biljana,Vracar Ljubomir M,Stojadinovic Ninoslav D,Pecovska-Djordjevic M,Novkovski N},
year={2003},
title={Stress-induced leakage currents in thin silicon dioxide films},
journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS},
volume={14},
number={10-12},
pages={805-807},
document_type={Article},
}