@ARTICLE{
author={Veljkovic Sandra,Mitrovic N,Davidovic Vojkan S,Paskaleva Albena,Spassov Dencho,Marjanovic M,Zivanovic Emilija N,Ristic Goran S,Dankovic Danijel M},
year={2026},
title={Influence of controlling signal parameters and prior stresses on the self-heating of VDMOS power transistors},
journal={MICROELECTRONICS RELIABILITY},
volume={181},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Djoric-Veljkovic Snezana M,Zivanovic Emilija N,Davidovic Vojkan S,Veljkovic Sandra,Mitrovic Nikola I,Ristic Goran S,Paskaleva Albena,Spassov Dencho,Dankovic Danijel M},
year={2025},
title={Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors},
journal={MICROMACHINES},
volume={16},
number={1},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Zivanovic Emilija N,Veljkovic Sandra,Mitrovic Nikola I,Jovanovic Igor D,Djoric-Veljkovic Snezana M,Paskaleva Albena,Spassov Dencho,Dankovic Danijel M},
year={2024},
title={A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress},
journal={MICROMACHINES},
volume={15},
number={4},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Veljkovic Sandra,Mitrovic Nikola I,Jovanovic Igor D,Zivanovic Emilija N,Paskaleva Albena,Spassov Dencho,Mancic Dragan D,Dankovic Danijel M},
year={2023},
title={Self-heating of stressed VDMOS devices under specific operating conditions},
journal={MICROELECTRONICS RELIABILITY},
volume={150},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Veljkovic Sandra,Mitrovic Nikola I,Davidovic Vojkan S,Golubovic Snezana M,Djoric-Veljkovic Snezana M,Paskaleva Albena,Spassov Dencho,Stankovic Srboljub J,Andjelkovic Marko Lj,Prijic Zoran D,Manic Ivica Dj,Prijic Aneta P,Ristic Goran S,Dankovic Danijel M},
year={2022},
title={Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress},
journal={JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS},
volume={31},
number={18},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Spassov Dencho,Paskaleva Albena,Guziewicz Elzbieta,Davidovic Vojkan S,Stankovic Srboljub J,Djoric-Veljkovic Snezana M,Ivanov Tzvetan,Stanchev Todor,Stojadinovic Ninoslav D},
year={2021},
title={Radiation Tolerance and Charge Trapping Enhancement of ALD HfO2/Al2O3 Nanolaminated Dielectrics},
journal={MATERIALS},
volume={14},
number={4},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Spassov Dencho,Paskaleva Albena,Davidovic Vojkan S,Djoric-Veljkovic Snezana M,Stankovic Srboljub J,Stojadinovic Ninoslav D,Ivanov Tzvetan,Stanchev Todor},
year={2019},
title={Impact of gamma Radiation on Charge Trapping Properties of Nanolaminated HfO2/Al2O3 ALD Stacks},
journal={2019 IEEE 31ST INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL 2019)},
volume={},
number={},
pages={59-62},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Dankovic Danijel M,Manic Ivica Dj,Prijic Aneta P,Davidovic Vojkan S,Prijic Zoran D,Golubovic Snezana M,Djoric-Veljkovic Snezana M,Paskaleva Albena,Spassov Dencho,Stojadinovic Ninoslav D},
year={2018},
title={A review of pulsed NBTI in P-channel power VDMOSFETs},
journal={MICROELECTRONICS RELIABILITY},
volume={82},
number={},
pages={28-36},
document_type={Review},
} 

@ARTICLE{
author={Dankovic Danijel M,Manic Ivica Dj,Stojadinovic Ninoslav D,Prijic Zoran D,Djoric-Veljkovic Snezana M,Davidovic Vojkan S,Prijic Aneta P,Paskaleva Albena,Spassov Dencho,Golubovic Snezana M},
year={2017},
title={Modelling of Threshold Voltage Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs},
journal={2017 IEEE 30TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL)},
volume={},
number={},
pages={147-151},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Davidovic Vojkan S,Paskaleva Albena,Spassov Dencho,Guziewicz Elzbieta,Krajewski T,Golubovic Snezana M,Djoric-Veljkovic Snezana M,Manic Ivica Dj,Dankovic Danijel M,Stojadinovic Ninoslav D},
year={2017},
title={Electrical and Charge Trapping Properties of HfO2/Al2O3 Multilayer Dielectric Stacks},
journal={2017 IEEE 30TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL)},
volume={},
number={},
pages={143-146},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Manic Ivica Dj,Atanassova E,Stojadinovic Ninoslav D,Spassov Dencho,Paskaleva Albena},
year={2011},
title={Hf-doped Ta2O5 stacks under constant voltage stress},
journal={MICROELECTRONIC ENGINEERING},
volume={88},
number={3},
pages={305-313},
document_type={Article},
}