@ARTICLE{
author={Atanassova E,Stojadinovic Ninoslav D,Spassov Dencho,Manic Ivica Dj,Paskaleva A},
year={2013},
title={Time-dependent dielectric breakdown in pure and lightly Al-doped Ta2O5 stacks},
journal={SEMICONDUCTOR SCIENCE AND TECHNOLOGY},
volume={28},
number={5},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Atanassova E,Stojadinovic Ninoslav D,Paskaleva A},
year={2008},
title={Degradation behavior of Ta2O5 stacks and its dependence on the gate electrode},
journal={MICROELECTRONICS RELIABILITY},
volume={48},
number={8-9},
pages={1193-1197},
document_type={Proceedings Paper},
} 

@ARTICLE{
author={Atanassova E,Stojadinovic Ninoslav D,Paskaleva A,Spassov D,Vracar Ljubomir M,Georgieva M},
year={2008},
title={Constant voltage stress induced current in Ta2O5 stacks and its dependence on a gate electrode},
journal={SEMICONDUCTOR SCIENCE AND TECHNOLOGY},
volume={23},
number={7},
pages={-},
document_type={Article},
}