@ARTICLE{
author={Jaksic Aleksandar,Nikolov Jovana B,Palma Alberto J},
year={2026},
title={Special Issue: Selected examples of applications of radiation in science and technology},
journal={EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS},
volume={},
number={},
pages={-},
document_type={Editorial Material; Early Access},
} 

@ARTICLE{
author={Mitrovic Nikola I,Guirado Damian,Dankovic Danijel M,Palma Alberto J,Ristic Goran S,Carvajal Miguel A},
year={2024},
title={Thermal Annealing-Induced Recovery of the VT of Irradiated Commercial MOS Transistors},
journal={JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS},
volume={},
number={},
pages={-},
document_type={Article; Early Access},
} 

@ARTICLE{
author={Jaksic Aleksandar,Nikolov Jovana B,Palma Alberto J},
year={2023},
title={Special issue: applications of radiation in science and technology},
journal={EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS},
volume={232},
number={10},
pages={1459-1463},
document_type={Editorial Material},
} 

@ARTICLE{
author={Andjelkovic Marko,Simevski Aleksandar,Chen Junchao,Schrape Oliver,Stamenkovic Zoran,Krstic Milos D,Ilic Stefan D,Ristic Goran S,Jaksic Aleksandar B,Vasovic Nikola,Duane Russell,Palma Alberto J,Lallena Antonio M,Carvajal Miguel Angel},
year={2022},
title={A Design Concept for Radiation Hardened RADFET Readout System for Space Applications},
journal={MICROPROCESSORS AND MICROSYSTEMS},
volume={90},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S,Ilic Stefan D,Andjelkovic Marko S,Duane Russell,Palma Alberto J,Lalena Antonio M,Krstic Milos D,Jaksic Aleksandar B},
year={2022},
title={Sensitivity and fading of irradiated RADFETs with different gate voltages},
journal={NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT},
volume={1029},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S,Ilic Stefan D,Veljkovic Sandra,Jevtic Aleksandar S,Dimitrijevic Strahinja D,Palma Alberto J,Stankovic Srboljub J,Andjelkovic Marko S},
year={2022},
title={Commercial P-Channel Power VDMOSFET as X-ray Dosimeter},
journal={ELECTRONICS},
volume={11},
number={6},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Ilic Stefan D,Andjelkovic Marko S,Duane Russell,Palma Alberto J,Sarajlic Milija J,Stankovic Srboljub J,Ristic Goran S},
year={2021},
title={Recharging process of commercial floating-gate MOS transistor in dosimetry application},
journal={MICROELECTRONICS RELIABILITY},
volume={126},
number={},
pages={-},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S,Ilic Stefan D,Duane Russell,Andjelkovic Marko S,Palma Alberto J,Lallena Antonio M,Krstic Milos D,Stankovic Srboljub J,Jaksic Aleksandar B},
year={2021},
title={Radiation sensitive MOSFETs irradiated with various positive gate biases},
journal={JOURNAL OF RADIATION RESEARCH AND APPLIED SCIENCES},
volume={14},
number={1},
pages={353-357},
document_type={Article},
} 

@ARTICLE{
author={Ristic Goran S,Andjelkovic Marko S,Duane Russell,Palma Alberto J,Jaksic Aleksandar B},
year={2021},
title={Radiation and Spontaneous Annealing of Radiation-sensitive Field-effect Transistors with Gate Oxide Thicknesses of 400 and 1000 nm},
journal={SENSORS AND MATERIALS},
volume={33},
number={6},
pages={2109-2116},
document_type={Article},
} 

@ARTICLE{
author={Andjelkovic Marko S,Simevski Aleksandar,Chen Junchao,Schrape Oliver,Stamenkovic Zoran,Krstic Milos D,Ilic Stefan D,Spahic Luka,Kostic Laza,Ristic Goran S,Jaksic Aleksandar B,Palma Alberto J,Lallena Antonio M,Carvajal Miguel Angel},
year={2020},
title={Design of Radiation Hardened RADFET Readout System for Space Applications},
journal={2020 23RD EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN (DSD 2020)},
volume={},
number={},
pages={484-488},
document_type={Proceedings Paper},
}