@ARTICLE{
author={Kwa KSK,Chattopadhyay S,Jankovic Nebojsa D,Olsen SH,Driscoll LS,O'Neill AG},
year={2003},
title={A model for capacitance reconstruction from measured lossy MOS capacitance-voltage characteristics},
journal={SEMICONDUCTOR SCIENCE AND TECHNOLOGY},
volume={18},
number={2},
pages={82-87},
document_type={Article},
}